Kathleen Susan Krisch

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Scotch Plains, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Detecting defects in integrated circuits
- Patent number 6,043,662
- Issue date Mar 28, 2000
- Glenn Baldwin Alers
- G01 - MEASURING TESTING
Information Patent Grant
Detecting breakdown in dielectric layers
- Patent number 5,804,975
- Issue date Sep 8, 1998
- Lucent Technologies Inc.
- Glenn Baldwin Alers
- G01 - MEASURING TESTING