Kathryn Anne Poole

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for the combined analysis of a sample with obj...
- Patent number 8,898,809
- Issue date Nov 25, 2014
- JPK Instruments AG
- Torsten Müller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring probe device for a probe microscope, measuring cell and s...
- Patent number 8,505,109
- Issue date Aug 6, 2013
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for providing a probe for a probe-microscopic analysis of a...
- Patent number 7,971,266
- Issue date Jun 28, 2011
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJ...
- Publication number 20100263098
- Publication date Oct 14, 2010
- Torsten Müller
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND S...
- Publication number 20100263096
- Publication date Oct 14, 2010
- Torsten Jähnke
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method for providing a probe for a probe-microscopic analysis of a...
- Publication number 20090300807
- Publication date Dec 3, 2009
- Torsten Jähnke
- G01 - MEASURING TESTING