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Katsuaki Abe

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Patents Grantslast 30 patents

  • Information Patent Grant

    Electron microscope
    • Patent number 7,214,937
    • Issue date May 8, 2007
    • Hitachi, Ltd.
    • Katsuaki Abe
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEM TYPE DEFECT OBSERVATION DEVICE AND DEFECT IMAGE ACQUIRING METHOD
    • Publication number 20120327212
    • Publication date Dec 27, 2012
    • Hitachi High-Technologies Corporation
    • Katsuhiro Kitahashi
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Electron microscope
    • Publication number 20050145793
    • Publication date Jul 7, 2005
    • Katsuaki Abe
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Electron microscope
    • Publication number 20020024012
    • Publication date Feb 28, 2002
    • Katsuaki Abe
    • G01 - MEASURING TESTING