Katsuaki Sakamoto

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Circuit for protecting DUT, method for protecting DUT, testing appa...
- Patent number 7,701,241
- Issue date Apr 20, 2010
- Tokyo Electron Limited
- Yasunori Kumagai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, probe card and inspection method
- Patent number 7,586,317
- Issue date Sep 8, 2009
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS, PROBE CARD AND INSPECTION METHOD
- Publication number 20090021272
- Publication date Jan 22, 2009
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR PROTECTING DUT, METHOD FOR PROTECTING DUT, TESTING APPA...
- Publication number 20070223156
- Publication date Sep 27, 2007
- TOKYO ELECTRON LIMITED
- Yasunori Kumagai
- G01 - MEASURING TESTING