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Katsuaki Takahashi

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTROCHEMILUMINESCENCE METHOD OF DETECTING AN ANALYTE IN A LIQUID...
    • Publication number 20230251253
    • Publication date Aug 10, 2023
    • Roche Diagnostics Operations, Inc.
    • Ralf Kraus
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROCHEMILUMINESCENCE METHOD OF DETECTING AN ANALYTE IN A LIQUID...
    • Publication number 20200003768
    • Publication date Jan 2, 2020
    • Roche Diagnostics Operations, Inc.
    • Ralf Kraus
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160124008
    • Publication date May 5, 2016
    • Roche Diagnostics Operations, Inc.
    • Reinhold Kraemer
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20160084827
    • Publication date Mar 24, 2016
    • Hitachi High-Technologies Corporation
    • Susumu SAKAIRI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20140271359
    • Publication date Sep 18, 2014
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140037503
    • Publication date Feb 6, 2014
    • Hitachi High-Technologies Corporation
    • Yukinori Sakashita
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130287629
    • Publication date Oct 31, 2013
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130125671
    • Publication date May 23, 2013
    • Hitachi High-Technologies Corporation
    • Yukinori Sakashita
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130108508
    • Publication date May 2, 2013
    • Hitachi High-Technologies Corporation
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130089464
    • Publication date Apr 11, 2013
    • Yukinori SAKASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING DEVICE AND DEVICE FOR OPENING AND CLOSING COVER...
    • Publication number 20120328475
    • Publication date Dec 27, 2012
    • F. HOFFMAN-LA ROCHE AG
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120301359
    • Publication date Nov 29, 2012
    • Reinhold Kraemer
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120258012
    • Publication date Oct 11, 2012
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20110300021
    • Publication date Dec 8, 2011
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20090068063
    • Publication date Mar 12, 2009
    • Hideyasu CHIBA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC MULTI-PURPOSE ANALYZER
    • Publication number 20090060785
    • Publication date Mar 5, 2009
    • Takanori SHIMANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20090060784
    • Publication date Mar 5, 2009
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080206097
    • Publication date Aug 28, 2008
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Protection circuit for power management semiconductor devices and p...
    • Publication number 20080074819
    • Publication date Mar 27, 2008
    • Hitachi, Ltd
    • Masataka Sasaki
    • B60 - VEHICLES IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050135967
    • Publication date Jun 23, 2005
    • Tetsuya Isobe
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050112025
    • Publication date May 26, 2005
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Protection circuit for power management semiconductor devices and p...
    • Publication number 20040252432
    • Publication date Dec 16, 2004
    • Hitachi, Ltd.
    • Masataka Sasaki
    • B60 - VEHICLES IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040208787
    • Publication date Oct 21, 2004
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040185549
    • Publication date Sep 23, 2004
    • Takehiro Fujita
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040105783
    • Publication date Jun 3, 2004
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040067165
    • Publication date Apr 8, 2004
    • Tetsuya Isobe
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzing apparatus
    • Publication number 20030147778
    • Publication date Aug 7, 2003
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analysis system
    • Publication number 20020016683
    • Publication date Feb 7, 2002
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Application

    Dispensing apparatus
    • Publication number 20020006668
    • Publication date Jan 17, 2002
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING