Katsufumi MORIYAMA

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Tsuchiura-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inner surface shape measurement device, and alignment method and ma...
- Patent number 11,740,072
- Issue date Aug 29, 2023
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Inner surface shape measurement device, and alignment method for in...
- Patent number 11,740,074
- Issue date Aug 29, 2023
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...
- Publication number 20240393097
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE
- Publication number 20240393098
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASUREMENT METHOD
- Publication number 20240393104
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD FOR IN...
- Publication number 20230028748
- Publication date Jan 26, 2023
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD AND MA...
- Publication number 20230003510
- Publication date Jan 5, 2023
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING