Katsuhiko Ichinose

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Tokorozawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect image processing apparatus, defect image processing method,...
- Patent number 8,995,748
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor defect classifying method, semiconductor defect class...
- Patent number 8,595,666
- Issue date Nov 26, 2013
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...
- Publication number 20120141011
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEFECT CLASSIFYING METHOD, SEMICONDUCTOR DEFECT CLASS...
- Publication number 20120131529
- Publication date May 24, 2012
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING