Katsuhiko Ikeda

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device testing apparatus
- Patent number 8,363,924
- Issue date Jan 29, 2013
- Advantest Corporation
- Katsuhiko Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method of electronic device test apparatus
- Patent number 8,294,759
- Issue date Oct 23, 2012
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION METHOD OF ELECTRONIC DEVICE TEST APPARATUS
- Publication number 20090278926
- Publication date Nov 12, 2009
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE TESTING APPARATUS
- Publication number 20090127068
- Publication date May 21, 2009
- Advantest Corporation
- Katsuhiko Ikeda
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS
- Publication number 20090122069
- Publication date May 14, 2009
- Kabushiki Kaisha Toshiba
- Masaaki Furusawa
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS