Katsuhiko Inaba

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Control apparatus, system, method, and program
- Patent number 11,788,974
- Issue date Oct 17, 2023
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis device and method for optical axis alignment thereof
- Patent number 10,837,923
- Issue date Nov 17, 2020
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer
- Patent number 10,585,053
- Issue date Mar 10, 2020
- Rigaku Corporation
- Shintaro Kobayashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for measuring bowing of single-crystal substrate
- Patent number 10,444,168
- Issue date Oct 15, 2019
- Rigaku Corporation
- Katsuhiko Inaba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 9,218,315
- Issue date Dec 22, 2015
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Grant
X-ray intensity correction method and X-ray diffractometer
- Patent number 9,086,367
- Issue date Jul 21, 2015
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus and X-ray diffraction measurement method
- Patent number 9,074,992
- Issue date Jul 7, 2015
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam conditioning device and X-ray analysis apparatus
- Patent number 7,684,543
- Issue date Mar 23, 2010
- Rigaku Corporation
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and device for judging polarity of single crystal sample
- Patent number 7,680,246
- Issue date Mar 16, 2010
- Rigaku Corporation
- Katsuhiko Inaba
- G01 - MEASURING TESTING
Information Patent Grant
Method of setting measuring range of reciprocal-space mapping
- Patent number 6,999,557
- Issue date Feb 14, 2006
- Rigaku Corporation
- Susumu Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thin film, and thin film deposit...
- Patent number 6,970,532
- Issue date Nov 29, 2005
- Rigaku Corporation
- Seiichi Hayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20210181126
- Publication date Jun 17, 2021
- Rigaku Corporation
- Shintaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS DEVICE AND METHOD FOR OPTICAL AXIS ALIGNMENT THEREOF
- Publication number 20200003708
- Publication date Jan 2, 2020
- Rigaku Corporation
- SHINTARO KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTOMETER
- Publication number 20170363550
- Publication date Dec 21, 2017
- Rigaku Corporation
- Shintaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING BOWING OF SINGLE-CRYSTAL SUBSTRATE
- Publication number 20140379282
- Publication date Dec 25, 2014
- Rigaku Corporation
- Katsuhiko INABA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20130138382
- Publication date May 30, 2013
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER
- Publication number 20130121460
- Publication date May 16, 2013
- Rigaku Corporation
- Toru MITSUNAGA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD
- Publication number 20120140890
- Publication date Jun 7, 2012
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Judging Polarity of Single Crystal Sample
- Publication number 20090225946
- Publication date Sep 10, 2009
- Rigaku Corporation
- Katsuhiko Inaba
- G01 - MEASURING TESTING
Information Patent Application
X-ray beam conditioning device and X-ray analysis apparatus
- Publication number 20070003013
- Publication date Jan 4, 2007
- Rigaku Corporation
- Ryuji Matsuo
- G01 - MEASURING TESTING
Information Patent Application
Method of setting measuring range of reciprocal-space mapping
- Publication number 20040240611
- Publication date Dec 2, 2004
- Rigaku Corporation
- Susumu Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring thin film, and thin film deposit...
- Publication number 20010043668
- Publication date Nov 22, 2001
- Rigaku Corporation
- Seiichi Hayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Katsuhiko Inaba

Person

Patents Grantslast 30 patents

Control apparatus, system, method, and program

X-ray analysis device and method for optical axis alignment thereof

X-ray diffractometer

Method and apparatus for measuring bowing of single-crystal substrate

X-ray analysis apparatus

X-ray intensity correction method and X-ray diffractometer

X-ray diffraction apparatus and X-ray diffraction measurement method

X-ray beam conditioning device and X-ray analysis apparatus

Method and device for judging polarity of single crystal sample

Method of setting measuring range of reciprocal-space mapping

Method and apparatus for measuring thin film, and thin film deposit...

Patents Applicationslast 30 patents

CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM

X-RAY ANALYSIS DEVICE AND METHOD FOR OPTICAL AXIS ALIGNMENT THEREOF

X-RAY DIFFRACTOMETER

METHOD AND APPARATUS FOR MEASURING BOWING OF SINGLE-CRYSTAL SUBSTRATE

X-RAY ANALYSIS APPARATUS

X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD

Method and Device for Judging Polarity of Single Crystal Sample

X-ray beam conditioning device and X-ray analysis apparatus

Method of setting measuring range of reciprocal-space mapping

Method and apparatus for measuring thin film, and thin film deposit...