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Katsuhiko Kato

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  • Hamamatsu-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Spectroscope and spectroscope production method
    • Patent number 11,725,986
    • Issue date Aug 15, 2023
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectral module and method for manufacturing spectral module
    • Patent number 11,493,386
    • Issue date Nov 8, 2022
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscope
    • Patent number 11,262,240
    • Issue date Mar 1, 2022
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer
    • Patent number D933509
    • Issue date Oct 19, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D933510
    • Issue date Oct 19, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D913826
    • Issue date Mar 23, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D913132
    • Issue date Mar 16, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D911194
    • Issue date Feb 23, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D910471
    • Issue date Feb 16, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectroscope
    • Patent number 10,883,877
    • Issue date Jan 5, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscope
    • Patent number 10,871,397
    • Issue date Dec 22, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G02 - OPTICS
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D890005
    • Issue date Jul 14, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D889294
    • Issue date Jul 7, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D885223
    • Issue date May 26, 2020
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884531
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884533
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884534
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884532
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884530
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D883116
    • Issue date May 5, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D883117
    • Issue date May 5, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D880323
    • Issue date Apr 7, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D878226
    • Issue date Mar 17, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectroscope
    • Patent number 10,539,461
    • Issue date Jan 21, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscope, and spectroscope production method
    • Patent number 10,408,677
    • Issue date Sep 10, 2019
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Grant

    Optical element, and method for producing same
    • Patent number 10,386,552
    • Issue date Aug 20, 2019
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Grant

    Spectroscope
    • Patent number 10,260,944
    • Issue date Apr 16, 2019
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G02 - OPTICS
  • Information Patent Grant

    Spectrometer
    • Patent number D839117
    • Issue date Jan 29, 2019
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D839116
    • Issue date Jan 29, 2019
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectroscope
    • Patent number 10,184,834
    • Issue date Jan 22, 2019
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SPECTROSCOPE AND SPECTROSCOPE PRODUCTION METHOD
    • Publication number 20230332952
    • Publication date Oct 19, 2023
    • HAMAMATSU PHOTONICS K. K.
    • Takafumi YOKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTRAL MODULE AND METHOD FOR MANUFACTURING SPECTRAL MODULE
    • Publication number 20220412801
    • Publication date Dec 29, 2022
    • Hamamatsu Photonics K. K.
    • Takafumi YOKINO
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    SPECTROSCOPE AND SPECTROSCOPE PRODUCTION METHOD
    • Publication number 20220099490
    • Publication date Mar 31, 2022
    • Hamamatsu Photonics K.K.
    • Takafumi YOKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROMETER
    • Publication number 20220099487
    • Publication date Mar 31, 2022
    • Hamamatsu Photonics K.K.
    • Takafumi YOKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTRAL MODULE AND METHOD FOR MANUFACTURING SPECTRAL MODULE
    • Publication number 20210278277
    • Publication date Sep 9, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi YOKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20210010863
    • Publication date Jan 14, 2021
    • HAMAMATSU PHOTONICS K. K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20200109989
    • Publication date Apr 9, 2020
    • HAMAMATSU PHOTONICS K. K.
    • Takafumi Yokino
    • G02 - OPTICS
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20190250036
    • Publication date Aug 15, 2019
    • HAMAMATSU PHOTONICS K. K.
    • Takafumi Yokino
    • G02 - OPTICS
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20190154504
    • Publication date May 23, 2019
    • HAMAMATSU PHOTONICS K. K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20190056267
    • Publication date Feb 21, 2019
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G02 - OPTICS
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20180224330
    • Publication date Aug 9, 2018
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G02 - OPTICS
  • Information Patent Application

    SPECTROSCOPE, AND SPECTROSCOPE PRODUCTION METHOD
    • Publication number 20180216997
    • Publication date Aug 2, 2018
    • Hamamatsu Photonics K.K.
    • Takafumi YOKINO
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Application

    OPTICAL ELEMENT, AND METHOD FOR PRODUCING SAME
    • Publication number 20170160449
    • Publication date Jun 8, 2017
    • HAMAMATSU PHOTONICS K. K.
    • Katsumi SHIBAYAMA
    • G02 - OPTICS
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20170010156
    • Publication date Jan 12, 2017
    • Takafumi YOKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ELEMENT, AND METHOD FOR PRODUCING SAME
    • Publication number 20150205017
    • Publication date Jul 23, 2015
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G02 - OPTICS
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20140268138
    • Publication date Sep 18, 2014
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPE
    • Publication number 20140192354
    • Publication date Jul 10, 2014
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING