Katsuhiko Miki

Person

Annaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Quartz glass crucible, method for producing the same, and method fo...
- Patent number 9,376,336
- Issue date Jun 28, 2016
- Shin-Etsu Handotai Co., Ltd.
- Akihiro Kimura
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Silicon single crystal wafer, epitaxial silicon wafer, and methods...
- Patent number 6,478,883
- Issue date Nov 12, 2002
- Shin-Etsu Handotai Co., Ltd.
- Masaro Tamatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon single crystal wafer and method for producing silicon singl...
- Patent number 6,299,982
- Issue date Oct 9, 2001
- Shin-Etsu Handotai Co., Ltd.
- Masaro Tamatsuka
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for producing silicon single crystal wafer for particle moni...
- Patent number 6,291,874
- Issue date Sep 18, 2001
- Shin-Etsu Handotai Co., Ltd.
- Masaro Tamatsuka
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of controlling misfit dislocation
- Patent number 5,395,770
- Issue date Mar 7, 1995
- Shin-Etsu Handotai Co., Ltd.
- Katsuhiko Miki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern shift measuring method
- Patent number 5,241,361
- Issue date Aug 31, 1993
- Shin-Etsu Handotai
- Katsuhiko Miki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluation of transition region of silicon epitaxial wafer
- Patent number 5,099,122
- Issue date Mar 24, 1992
- Shin-Etsu Handotai Co., Ltd.
- Katsuhiko Miki
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
QUARTZ GLASS CRUCIBLE, METHOD FOR PRODUCING THE SAME, AND METHOD FO...
- Publication number 20130174777
- Publication date Jul 11, 2013
- Shin-Etsu Handotai Co., Ltd.
- Akihiro Kimura
- C30 - CRYSTAL GROWTH

Katsuhiko Miki

Person

Patents Grantslast 30 patents

Quartz glass crucible, method for producing the same, and method fo...

Silicon single crystal wafer, epitaxial silicon wafer, and methods...

Silicon single crystal wafer and method for producing silicon singl...

Method for producing silicon single crystal wafer for particle moni...

Method of controlling misfit dislocation

Pattern shift measuring method

Method for evaluation of transition region of silicon epitaxial wafer

Patents Applicationslast 30 patents

QUARTZ GLASS CRUCIBLE, METHOD FOR PRODUCING THE SAME, AND METHOD FO...