Katsuhiko Namiki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card holding apparatus with probe card engagement structure
- Patent number 8,710,855
- Issue date Apr 29, 2014
- Advantest Corporation
- Katsuhiko Namiki
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device test apparatus and method of mounting of performa...
- Patent number 8,013,624
- Issue date Sep 6, 2011
- Advantest Corporation
- Katsuhiko Namiki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system
- Patent number 7,135,853
- Issue date Nov 14, 2006
- Avantest Corporation
- Yoshimasa Ito
- G01 - MEASURING TESTING
Information Patent Grant
Modular connector assembly
- Patent number 6,709,296
- Issue date Mar 23, 2004
- Advantest Corporation
- Kouichi Shiroyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD HOLDING APPARATUS
- Publication number 20120025858
- Publication date Feb 2, 2012
- Advantest Corporation
- Katsuhiko Namiki
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Test Apparatus and Method of Mounting of Performa...
- Publication number 20090237100
- Publication date Sep 24, 2009
- Advantest Corporation
- Katsuhiko Namiki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system
- Publication number 20050077892
- Publication date Apr 14, 2005
- Advantest Corporation
- Yoshimasa Ito
- G01 - MEASURING TESTING
Information Patent Application
Connector
- Publication number 20020142662
- Publication date Oct 3, 2002
- Kouichi Shiroyama
- H01 - BASIC ELECTRIC ELEMENTS