Katsuhiko Sakai

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Control system, control determination device, and control method
- Patent number 11,570,206
- Issue date Jan 31, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroshi Suzuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged particle beam apparatus and dimension measuring method
- Patent number 8,030,614
- Issue date Oct 4, 2011
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and dimension measuring method
- Patent number 7,973,282
- Issue date Jul 5, 2011
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and dimension measuring method
- Patent number 7,214,936
- Issue date May 8, 2007
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTROL SYSTEM, CONTROL DETERMINATION DEVICE, AND CONTROL METHOD
- Publication number 20210029160
- Publication date Jan 28, 2021
- Nippon Telegraph and Telephone Corporation
- Hiroshi Suzuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND DIMENSION MEASURING METHOD
- Publication number 20090314938
- Publication date Dec 24, 2009
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and dimension measuring method
- Publication number 20080100832
- Publication date May 1, 2008
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and dimension measuring method
- Publication number 20060071166
- Publication date Apr 6, 2006
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS