Katsuhiko Satou

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card and contactor of the same
- Patent number 7,106,080
- Issue date Sep 12, 2006
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for examining semiconductor devices on semiconductor wafers
- Patent number 7,081,766
- Issue date Jul 25, 2006
- Japan Electronic Materials Corp.
- Katsuhiko Satou
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and contactor of the same
- Patent number 6,967,493
- Issue date Nov 22, 2005
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card and contactor of the same
- Publication number 20050083072
- Publication date Apr 21, 2005
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20040257098
- Publication date Dec 23, 2004
- Katsuhiko Satou
- G01 - MEASURING TESTING