Katsuhiko Watabe

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Osaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Environmental test apparatus
- Patent number 8,342,046
- Issue date Jan 1, 2013
- ESPEC Corp.
- Seiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Cooling apparatus
- Patent number 7,558,064
- Issue date Jul 7, 2009
- ESPEC Corp.
- Kazuhiro Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Environmental test apparatus
- Patent number 7,497,136
- Issue date Mar 3, 2009
- ESPEC Corp.
- Seiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in apparatus
- Patent number 7,498,830
- Issue date Mar 3, 2009
- ESPEC Corp.
- Kazuhiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cooling apparatus
- Patent number 7,257,956
- Issue date Aug 21, 2007
- ESPEC Corp.
- Tetsuya Shimada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENVIRONMENTAL TEST APPARATUS
- Publication number 20230417632
- Publication date Dec 28, 2023
- ESPEC CORP.
- Haruki SETO
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENTAL TEST APPARATUS
- Publication number 20090133514
- Publication date May 28, 2009
- ESPEC CORP.
- Seiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENTAL TEST APPARATUS
- Publication number 20080141794
- Publication date Jun 19, 2008
- ESPEC CORP.
- Seiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
Burn-in apparatus
- Publication number 20060032627
- Publication date Feb 16, 2006
- ESPEC CORP.
- Kazuhiro Nakamura
- G05 - CONTROLLING REGULATING
Information Patent Application
Cooling apparatus
- Publication number 20060021364
- Publication date Feb 2, 2006
- ESPEC CORP.
- Tetsuya Shimada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cooling apparatus
- Publication number 20060023424
- Publication date Feb 2, 2006
- ESPEC CORP.
- Kazuhiro Nakamura
- G01 - MEASURING TESTING