Katsuhiro Kambara

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample discrimination system and sample automatic processing appara...
- Patent number 12,123,885
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Tooru Miyasaka
- G01 - MEASURING TESTING
Information Patent Grant
Body-to-be-conveyed, container carrier, and conveying device
- Patent number 12,098,039
- Issue date Sep 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryosuke Hoshi
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Transport device and specimen analysis system including transport d...
- Patent number 11,933,801
- Issue date Mar 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Aoyama
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Conveyance apparatus, sample analysis system including the same, an...
- Patent number 11,887,780
- Issue date Jan 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Aoyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conveying device, sample analysis system and sample pretreatment de...
- Patent number 11,851,282
- Issue date Dec 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Aoyama
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Conveying device
- Patent number 11,772,911
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Aoyama
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Sample container loading or storing unit and sample test automation...
- Patent number 11,467,173
- Issue date Oct 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Masashi Endo
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus
- Patent number 11,467,174
- Issue date Oct 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshihiro Kabe
- G01 - MEASURING TESTING
Information Patent Grant
Specimen inspection automation system
- Patent number 11,209,450
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Kohei Kinugawa
- G01 - MEASURING TESTING
Information Patent Grant
Plug processing device and specimen test automation system includin...
- Patent number 11,061,044
- Issue date Jul 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 10,605,818
- Issue date Mar 31, 2020
- Hitachi High-Technologies Corporation
- Kazuhiro Noda
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Nozzle cleaning method and automated analyzer
- Patent number 10,307,782
- Issue date Jun 4, 2019
- Hitachi High-Technologies Corporation
- Takushi Miyakawa
- B08 - CLEANING
Information Patent Grant
Automatic analysis device
- Patent number 10,267,816
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Automatic analyzer
- Patent number 9,791,465
- Issue date Oct 17, 2017
- Hitachi High-Technologies Corporation
- Yukinori Sakashita
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,678,093
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Susumu Sakairi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 9,291,634
- Issue date Mar 22, 2016
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Clinical analyzer
- Patent number D751725
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D24 - Medical and laboratory equipment
Information Patent Grant
Clinical analyzer
- Patent number D740956
- Issue date Oct 13, 2015
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D24 - Medical and laboratory equipment
Information Patent Grant
Cover for clinical analyzer
- Patent number D740957
- Issue date Oct 13, 2015
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D24 - Medical and laboratory equipment
Information Patent Grant
Clinical analyzer
- Patent number D740435
- Issue date Oct 6, 2015
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D24 - Medical and laboratory equipment
Information Patent Grant
Automatic analysis apparatus and automatic analysis method
- Patent number 8,997,589
- Issue date Apr 7, 2015
- Hitachi High-Technologies Corporation
- Hidenobu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and the analyzing method using the same
- Patent number 8,765,474
- Issue date Jul 1, 2014
- Hitachi High-Technologies Corporation
- Katsuhiro Kambara
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 8,658,102
- Issue date Feb 25, 2014
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 8,278,108
- Issue date Oct 2, 2012
- Hitachi High-Technologies Corporation
- Kentaro Wada
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 7,955,557
- Issue date Jun 7, 2011
- Hitachi, Ltd.
- Shigenori Watari
- G01 - MEASURING TESTING
Information Patent Grant
Reaction container for chemical analysis with the controlled surfac...
- Patent number 7,820,114
- Issue date Oct 26, 2010
- Hitachi, Ltd.
- Mina Amo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic analyzer
- Patent number 7,771,656
- Issue date Aug 10, 2010
- Hitachi, Ltd.
- Takeshi Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 7,722,815
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 7,670,558
- Issue date Mar 2, 2010
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Sample dispensing apparatus and automatic analyzer using the same
- Patent number 7,027,935
- Issue date Apr 11, 2006
- Hitachi High-Technologies Corp.
- Akihiro Shimase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Body-To-Be-Conveyed, Container Carrier, and Conveying Device
- Publication number 20240140735
- Publication date May 2, 2024
- Hitachi High-Tech Corporation
- Ryosuke HOSHI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Transport Device and Specimen Analysis System Including Transport D...
- Publication number 20230138212
- Publication date May 4, 2023
- Hitachi High-Tech Corporation
- Yasuaki AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
Conveying Device
- Publication number 20220306405
- Publication date Sep 29, 2022
- Hitachi High-Tech Corporation
- Yasuaki AOYAMA
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CONVEYING DEVICE AND ANALYSIS SYSTEM
- Publication number 20220274792
- Publication date Sep 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeshi TAMAKOSHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Conveyance Device, and Specimen Analysis System and Specimen Pretre...
- Publication number 20220252627
- Publication date Aug 11, 2022
- Hitachi High-Tech Corporation
- Yasuaki AOYAMA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TRANSPORT APPARATUS
- Publication number 20220252628
- Publication date Aug 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeshi TAMAKOSHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TRANSPORT DEVICE AND TRANSPORT METHOD
- Publication number 20220238267
- Publication date Jul 28, 2022
- Ryosuke HOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conveying Device, Sample Analysis System and Sample Pretreatment D...
- Publication number 20220144556
- Publication date May 12, 2022
- Hitachi High-Tech Corporation
- Yasuaki AOYAMA
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Conveyance Apparatus, Sample Analysis System Including the Same, an...
- Publication number 20210398723
- Publication date Dec 23, 2021
- Hitachi High-Tech Corporation
- Yasuaki AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISCRIMINATION SYSTEM AND SAMPLE AUTOMATIC PROCESSING APPARA...
- Publication number 20210373041
- Publication date Dec 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Tooru MIYASAKA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER LOADING OR STORING UNIT AND SAMPLE TEST AUTOMATION...
- Publication number 20200225252
- Publication date Jul 16, 2020
- Hitachi High-Technologies Corporation
- Masashi ENDO
- G01 - MEASURING TESTING
Information Patent Application
Plug Processing Device and Specimen Test Automation System Includin...
- Publication number 20190310276
- Publication date Oct 10, 2019
- Hitachi High-Technologies Corporation
- Toshiki YAMAGATA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic Analysis Apparatus
- Publication number 20190145997
- Publication date May 16, 2019
- Hitachi High-Technologies Corporation
- Yoshihiro KABE
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM
- Publication number 20190101558
- Publication date Apr 4, 2019
- Hitachi High-Technologies Corporation
- Kohei KINUGAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20180188275
- Publication date Jul 5, 2018
- Hitachi High-Technologies Corporation
- Kazuhiro NODA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20170205436
- Publication date Jul 20, 2017
- Hitachi High-Technologies Corporation
- Mitsuru OONUMA
- G01 - MEASURING TESTING
Information Patent Application
NOZZLE CLEANING METHOD AND AUTOMATED ANALYZER
- Publication number 20160193622
- Publication date Jul 7, 2016
- Hitachi High-Technologies Corporation
- Takushi MIYAKAWA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20160161521
- Publication date Jun 9, 2016
- Hitachi High-Technologies Corporation
- Susumu SAKAIRI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20150037214
- Publication date Feb 5, 2015
- Hitachi High-Technologies Corporation
- Yukinori Sakashita
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
- Publication number 20140147348
- Publication date May 29, 2014
- Hitachi High-Technologies Corporation
- Hajime KATOU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20110283779
- Publication date Nov 24, 2011
- Hitachi High-Technologies Corporation
- Kentaro Wada
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS METHOD
- Publication number 20110271773
- Publication date Nov 10, 2011
- Hitachi High-Technologies Corporation
- Hidenobu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
- Publication number 20100233027
- Publication date Sep 16, 2010
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
AUTOMATIC ANALYZER AND THE ANALYZING METHOD USING THE SAME
- Publication number 20080213903
- Publication date Sep 4, 2008
- Katsuhiro KAMBARA
- G01 - MEASURING TESTING
Information Patent Application
Chemical analysis apparatus and chemical analysis method
- Publication number 20070009387
- Publication date Jan 11, 2007
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Reaction container for chemical analysis with the controlled surfac...
- Publication number 20050047970
- Publication date Mar 3, 2005
- Mina Amo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic analyzer
- Publication number 20040076545
- Publication date Apr 22, 2004
- Hitachi, Ltd.
- Shigenori Watari
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic analyzer
- Publication number 20040057872
- Publication date Mar 25, 2004
- Takeshi Shibuya
- G01 - MEASURING TESTING
Information Patent Application
Sample dispensing apparatus and automatic analyzer using the same
- Publication number 20040034479
- Publication date Feb 19, 2004
- Akihiro Shimase
- G01 - MEASURING TESTING
Information Patent Application
Chemical analysis apparatus and chemical analysis method
- Publication number 20030166260
- Publication date Sep 4, 2003
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Katsuhiro Kambara

Person

Patents Grantslast 30 patents

Sample discrimination system and sample automatic processing appara...

Body-to-be-conveyed, container carrier, and conveying device

Transport device and specimen analysis system including transport d...

Conveyance apparatus, sample analysis system including the same, an...

Conveying device, sample analysis system and sample pretreatment de...

Conveying device

Sample container loading or storing unit and sample test automation...

Automatic analysis apparatus

Specimen inspection automation system

Plug processing device and specimen test automation system includin...

Automated analyzer

Nozzle cleaning method and automated analyzer

Automatic analysis device

Automatic analyzer

Automatic analyzer

Chemical analysis apparatus and chemical analysis method

Clinical analyzer

Clinical analyzer

Cover for clinical analyzer

Clinical analyzer

Automatic analysis apparatus and automatic analysis method

Automatic analyzer and the analyzing method using the same

Chemical analysis apparatus and chemical analysis method

Automatic analyzer

Automatic analyzer

Reaction container for chemical analysis with the controlled surfac...

Automatic analyzer

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

Sample dispensing apparatus and automatic analyzer using the same

Patents Applicationslast 30 patents

Body-To-Be-Conveyed, Container Carrier, and Conveying Device

Transport Device and Specimen Analysis System Including Transport D...

Conveying Device

CONVEYING DEVICE AND ANALYSIS SYSTEM

Conveyance Device, and Specimen Analysis System and Specimen Pretre...

TRANSPORT APPARATUS

TRANSPORT DEVICE AND TRANSPORT METHOD

Conveying Device, Sample Analysis System and Sample Pretreatment D...

Conveyance Apparatus, Sample Analysis System Including the Same, an...

SAMPLE DISCRIMINATION SYSTEM AND SAMPLE AUTOMATIC PROCESSING APPARA...

SAMPLE CONTAINER LOADING OR STORING UNIT AND SAMPLE TEST AUTOMATION...

Plug Processing Device and Specimen Test Automation System Includin...

Automatic Analysis Apparatus

SPECIMEN INSPECTION AUTOMATION SYSTEM

AUTOMATED ANALYZER

AUTOMATIC ANALYSIS DEVICE

NOZZLE CLEANING METHOD AND AUTOMATED ANALYZER

AUTOMATIC ANALYZER

AUTOMATIC ANALYZER

CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS METHOD

CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

AUTOMATIC ANALYZER AND THE ANALYZING METHOD USING THE SAME

Chemical analysis apparatus and chemical analysis method

Reaction container for chemical analysis with the controlled surfac...

Automatic analyzer

Automatic analyzer

Sample dispensing apparatus and automatic analyzer using the same

Chemical analysis apparatus and chemical analysis method