Katsuhiro Matsuyama

Person

Hachioji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cantilever for use in a scanning probe microscope
- Patent number 6,415,653
- Issue date Jul 9, 2002
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 6,097,197
- Issue date Aug 1, 2000
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope for measuring the electrical properties o...
- Patent number 5,929,643
- Issue date Jul 27, 1999
- Olympus Optical Co., Ltd.
- Nobuaki Sakai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
SPM cantilever and a method for manufacturing the same
- Patent number 5,883,387
- Issue date Mar 16, 1999
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever for use in a scanning probe microscope and method of man...
- Patent number 5,811,017
- Issue date Sep 22, 1998
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever chip
- Patent number 5,753,912
- Issue date May 19, 1998
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated sensor for scanning probe microscope
- Patent number 5,583,286
- Issue date Dec 10, 1996
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated AFM sensor
- Patent number 5,386,720
- Issue date Feb 7, 1995
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever chip for scanning probe microscope
- Patent number 5,367,165
- Issue date Nov 22, 1994
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever chip for use in scanning probe microscope
- Patent number 5,319,961
- Issue date Jun 14, 1994
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY

Katsuhiro Matsuyama

Person

Patents Grantslast 30 patents

Cantilever for use in a scanning probe microscope

Scanning probe microscope

Scanning probe microscope for measuring the electrical properties o...

SPM cantilever and a method for manufacturing the same

Cantilever for use in a scanning probe microscope and method of man...

Cantilever chip

Integrated sensor for scanning probe microscope

Integrated AFM sensor

Cantilever chip for scanning probe microscope

Cantilever chip for use in scanning probe microscope