Katsuhiro Nakagawa

Follow

Person

Hitachiohta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 7,075,069
- Issue date Jul 11, 2006
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 6,633,033
- Issue date Oct 14, 2003
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-trap mass analyzing apparatus and ion trap mass analyzing method
- Patent number 6,140,641
- Issue date Oct 31, 2000
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 5,756,993
- Issue date May 26, 1998
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G01 - MEASURING TESTING
Information Patent Grant
Control in mass analyzer
- Patent number 4,812,649
- Issue date Mar 14, 1989
- Hitachi, Ltd.
- Katsuhiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for mass spectrometry on an ion-trap method
- Publication number 20030205667
- Publication date Nov 6, 2003
- Hitachi, Ltd
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20020195556
- Publication date Dec 26, 2002
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for mass spectrometry on an ion-trap method
- Publication number 20020008199
- Publication date Jan 24, 2002
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap mass spectrometer and it's mass spectrometry method
- Publication number 20020005479
- Publication date Jan 17, 2002
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS