Katsuhiro Ohtani

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Nara, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and capacitance measurement method
- Patent number 6,894,520
- Issue date May 17, 2005
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of checking semiconductor storage d...
- Patent number 6,876,208
- Issue date Apr 5, 2005
- Renesas Technology Corp.
- Tatsuya Kunikiyo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for evaluating semiconductor device
- Publication number 20050193013
- Publication date Sep 1, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and capacitance measurement method
- Publication number 20030218473
- Publication date Nov 27, 2003
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of checking semiconductor storage d...
- Publication number 20030117151
- Publication date Jun 26, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Tatsuya Kunikiyo
- H01 - BASIC ELECTRIC ELEMENTS