Katsuhisa Iiyoshi

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Odawara, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for analyzing signal and signal analyzer having function for...
- Patent number 7,069,005
- Issue date Jun 27, 2006
- Anritsu Corporation
- Takayuki Morikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electronic measurement apparatus having a function to a display a f...
- Patent number 6,907,366
- Issue date Jun 14, 2005
- Anritsu Corporation
- Katsuhisa Iiyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display apparatus for easily realizing high-definition wav...
- Patent number 5,519,820
- Issue date May 21, 1996
- Anritsu Corporation
- Takehiko Kawauchi
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display apparatus for easily realizing high-definition wav...
- Patent number 5,434,954
- Issue date Jul 18, 1995
- Anritsu Corporation
- Takehiko Kawauchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for analyzing signal and signal analyzer having function for...
- Publication number 20040059546
- Publication date Mar 25, 2004
- Anritsu Corporation
- Takayuki Morikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electronic measurement apparatus having a function to a display a f...
- Publication number 20030191591
- Publication date Oct 9, 2003
- Katsuhisa Iiyoshi
- G01 - MEASURING TESTING