Katsuhito Nagano

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus and analysis method
- Patent number 7,529,994
- Issue date May 5, 2009
- Advantest Corporation
- Makoto Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Failure analyzing system and method for displaying the failure
- Patent number 7,071,833
- Issue date Jul 4, 2006
- Advantest Corporation
- Katsuhito Nagano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analysis apparatus and analysis method
- Publication number 20070240022
- Publication date Oct 11, 2007
- Advantest Corporation
- Makoto Shinohara
- G01 - MEASURING TESTING
Information Patent Application
Failure analyzing system and method for displaying the failure
- Publication number 20050270165
- Publication date Dec 8, 2005
- Advantest Corporation
- Katsuhito Nagano
- G05 - CONTROLLING REGULATING