Katsuji Ito

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder, method for use of the sample holder, and charged par...
- Patent number 8,853,648
- Issue date Oct 7, 2014
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- G01 - MEASURING TESTING
Information Patent Grant
Sample device for charged particle beam
- Patent number 8,729,497
- Issue date May 20, 2014
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE DEVICE FOR CHARGED PARTICLE BEAM
- Publication number 20130193343
- Publication date Aug 1, 2013
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, METHOD FOR USE OF THE SAMPLE HOLDER, AND CHARGED PAR...
- Publication number 20120112064
- Publication date May 10, 2012
- Yasuhira Nagakubo
- G01 - MEASURING TESTING