Katsumi Fujihara

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface defect inspection apparatus and surface defect inspection m...
- Patent number 8,854,613
- Issue date Oct 7, 2014
- Fujitsu Limited
- Katsumi Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 7,633,602
- Issue date Dec 15, 2009
- Fujitsu Limited
- Katsumi Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection system
- Patent number 4,547,895
- Issue date Oct 15, 1985
- Fujitsu Limited
- Kikuo Mita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system
- Patent number 4,392,120
- Issue date Jul 5, 1983
- A. Aoki & Associates
- Kikuo Mita
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE DEFECT INSPECTION APPARATUS AND SURFACE DEFECT INSPECTION M...
- Publication number 20120242984
- Publication date Sep 27, 2012
- Fujitsu Limited
- Katsumi FUJIHARA
- G01 - MEASURING TESTING
Information Patent Application
Measurement apparatus and measurement method
- Publication number 20080074650
- Publication date Mar 27, 2008
- Fujitsu Limited
- Katsumi Fujihara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Measurement apparatus and measurement method
- Publication number 20080074651
- Publication date Mar 27, 2008
- Fujitsu Limited
- Katsumi Fujihara
- G02 - OPTICS