Katsumi Ikegaya

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Akishima, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device yield prediction system and method
- Patent number 7,945,410
- Issue date May 17, 2011
- Hitachi, Ltd.
- Natsuyo Morioka
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE YIELD PREDICTION SYSTEM AND METHOD
- Publication number 20080140330
- Publication date Jun 12, 2008
- Natsuyo Morioka
- G05 - CONTROLLING REGULATING