Katsumi Kojima

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Hasuda, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device testing apparatus and test method
- Patent number 6,313,654
- Issue date Nov 6, 2001
- Advantest Corporation
- Yuichi Nansai
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test handler system for IC tester
- Patent number 5,865,319
- Issue date Feb 2, 1999
- Advantest Corp.
- Hiroshi Okuda
- G01 - MEASURING TESTING
Information Patent Grant
Automatic testing system and method for semiconductor devices
- Patent number 5,788,084
- Issue date Aug 4, 1998
- Advantest Corporation
- Takeshi Onishi
- G01 - MEASURING TESTING