Katsumi Nagumo

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analyzing apparatus and fine particle collecting apparatus
- Patent number 7,275,453
- Issue date Oct 2, 2007
- Hitachi, Ltd.
- Masanori Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting dangerous substances and substan...
- Patent number 6,884,997
- Issue date Apr 26, 2005
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analyzing apparatus and fine particle collecting apparatus
- Publication number 20050058575
- Publication date Mar 17, 2005
- Hitachi, Ltd
- Masanori Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting dangerous substance
- Publication number 20040124352
- Publication date Jul 1, 2004
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
Substance detection method and substance detection apparatus
- Publication number 20040028560
- Publication date Feb 12, 2004
- Katsumi Nagumo
- G01 - MEASURING TESTING