Katsumi Nishimura

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor laser device, and method and program for driving the...
- Patent number 11,764,542
- Issue date Sep 19, 2023
- Horiba, Ltd.
- Yusuke Awane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 10,935,489
- Issue date Mar 2, 2021
- Horiba, Ltd.
- Kyoji Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus, program for analysis apparatus, and analysis me...
- Patent number 10,605,726
- Issue date Mar 31, 2020
- Horiba, Ltd.
- Kyoji Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic analyzer and spectroscopic analysis method
- Patent number 10,345,230
- Issue date Jul 9, 2019
- Horiba, Ltd.
- Katsumi Nishimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectrophotometer and spectrophotometry method
- Patent number 10,241,038
- Issue date Mar 26, 2019
- Horiba, Ltd.
- Katsumi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Photodetector output correction method used for spectroscopic analyzer
- Patent number 10,066,992
- Issue date Sep 4, 2018
- Horiba, Ltd.
- Yoshitake Ando
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer and method for calibrating the same
- Patent number 8,629,397
- Issue date Jan 14, 2014
- Horiba Stec, Co., Ltd.
- Daisuke Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Material gas concentration control system
- Patent number 8,459,290
- Issue date Jun 11, 2013
- HORIBA, Ltd.
- Masakazu Minami
- G05 - CONTROLLING REGULATING
Information Patent Grant
Film formation apparatus and method of using the same
- Patent number 7,604,010
- Issue date Oct 20, 2009
- Tokyo Electron Limited
- Kazuhide Hasebe
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR LASER DEVICE, AND METHOD AND PROGRAM FOR DRIVING THE...
- Publication number 20200295535
- Publication date Sep 17, 2020
- HORIBA, LTD.
- Yusuke Awane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20190101491
- Publication date Apr 4, 2019
- Horiba, Ltd.
- Kyoji SHIBUYA
- G01 - MEASURING TESTING
Information Patent Application
SPECTROPHOTOMETER AND SPECTROPHOTOMETRY METHOD
- Publication number 20190064064
- Publication date Feb 28, 2019
- Horiba, Ltd.
- Katsumi NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, PROGRAM FOR ANALYSIS APPARATUS, AND ANALYSIS ME...
- Publication number 20180172581
- Publication date Jun 21, 2018
- Horiba, Ltd.
- Kyoji SHIBUYA
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYZER AND SPECTROSCOPIC ANALYSIS METHOD
- Publication number 20170299505
- Publication date Oct 19, 2017
- Horiba, Ltd.
- Katsumi NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTOR OUTPUT CORRECTION METHOD USED FOR SPECTROSCOPIC ANALYZER
- Publication number 20170023408
- Publication date Jan 26, 2017
- Horiba, Ltd.
- Yoshitake ANDO
- G01 - MEASURING TESTING
Information Patent Application
SPECTROPHOTOMETER AND METHOD FOR CALIBRATING THE SAME
- Publication number 20120250014
- Publication date Oct 4, 2012
- HORIBA STEC, CO., LTD.
- Daisuke Hayashi
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL GAS CONCENTRATION CONTROL SYSTEM
- Publication number 20100108154
- Publication date May 6, 2010
- HORIBA, Ltd.
- Masakazu Minami
- G05 - CONTROLLING REGULATING
Information Patent Application
Film formation apparatus and method of using the same
- Publication number 20060042544
- Publication date Mar 2, 2006
- Kazuhide Hasebe
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Katsumi Nishimura

Person

Patents Grantslast 30 patents

Semiconductor laser device, and method and program for driving the...

Analysis apparatus and analysis method

Analysis apparatus, program for analysis apparatus, and analysis me...

Spectroscopic analyzer and spectroscopic analysis method

Spectrophotometer and spectrophotometry method

Photodetector output correction method used for spectroscopic analyzer

Spectrophotometer and method for calibrating the same

Material gas concentration control system

Film formation apparatus and method of using the same

Patents Applicationslast 30 patents

SEMICONDUCTOR LASER DEVICE, AND METHOD AND PROGRAM FOR DRIVING THE...

ANALYSIS APPARATUS AND ANALYSIS METHOD

SPECTROPHOTOMETER AND SPECTROPHOTOMETRY METHOD

ANALYSIS APPARATUS, PROGRAM FOR ANALYSIS APPARATUS, AND ANALYSIS ME...

SPECTROSCOPIC ANALYZER AND SPECTROSCOPIC ANALYSIS METHOD

PHOTODETECTOR OUTPUT CORRECTION METHOD USED FOR SPECTROSCOPIC ANALYZER

SPECTROPHOTOMETER AND METHOD FOR CALIBRATING THE SAME

MATERIAL GAS CONCENTRATION CONTROL SYSTEM

Film formation apparatus and method of using the same