Katsumi Ootani

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,595,557
- Issue date Sep 29, 2009
- Panasonic Corporation
- Kazumi Watase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20060286689
- Publication date Dec 21, 2006
- Matsushita Electric Industrial Co., Ltd.
- Kazumi Watase
- G01 - MEASURING TESTING