Katsumi Setoguchi

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron beam observation device, electron beam observation system,...
- Patent number 11,170,969
- Issue date Nov 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Koichi Hamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing device, charged particle beam device, charged part...
- Patent number 9,702,695
- Issue date Jul 11, 2017
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image forming device and computer program
- Patent number 9,275,829
- Issue date Mar 1, 2016
- Hitachi High-Technologies Corporation
- Katsumi Setoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing method and plasma processing apparatus
- Patent number 7,611,993
- Issue date Nov 3, 2009
- Hitachi High-Technologies Corporation
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam adjustment method and apparatus
- Patent number 7,381,951
- Issue date Jun 3, 2008
- Hitachi High-Technologies Corporation
- Takashi Doi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Plasma processing method and plasma processing apparatus
- Patent number 6,888,094
- Issue date May 3, 2005
- Hitachi High-Technologies Corporation
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing method and plasma processing apparatus
- Patent number 6,700,090
- Issue date Mar 2, 2004
- Hitachi High-Technologies Corporation
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM OBSERVATION DEVICE, ELECTRON BEAM OBSERVATION SYSTEM,...
- Publication number 20210125806
- Publication date Apr 29, 2021
- Hitachi High-Technologies Corporation
- Koichi HAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image Processing Device, Charged Particle Beam Device, Charged Part...
- Publication number 20130146763
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Application
IMAGE FORMING DEVICE AND COMPUTER PROGRAM
- Publication number 20130141563
- Publication date Jun 6, 2013
- Hitachi High-Technologies Corporation
- Katsumi Setoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal Processing Method for Charged Particle Beam Device, and Sign...
- Publication number 20120138796
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Fumihiro Sasajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma Processing Method And Plasma Processing Apparatus
- Publication number 20070184562
- Publication date Aug 9, 2007
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam adjustment method and apparatus
- Publication number 20060043293
- Publication date Mar 2, 2006
- Takashi Doi
- G01 - MEASURING TESTING
Information Patent Application
Plasma processing method and plasma processing apparatus
- Publication number 20050183822
- Publication date Aug 25, 2005
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma processing method and plasma processing apparatus
- Publication number 20040159639
- Publication date Aug 19, 2004
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS

Katsumi Setoguchi

Person

Patents Grantslast 30 patents

Electron beam observation device, electron beam observation system,...

Image processing device, charged particle beam device, charged part...

Image forming device and computer program

Plasma processing method and plasma processing apparatus

Charged particle beam adjustment method and apparatus

Plasma processing method and plasma processing apparatus

Plasma processing method and plasma processing apparatus

Patents Applicationslast 30 patents

ELECTRON BEAM OBSERVATION DEVICE, ELECTRON BEAM OBSERVATION SYSTEM,...

Image Processing Device, Charged Particle Beam Device, Charged Part...

IMAGE FORMING DEVICE AND COMPUTER PROGRAM

Signal Processing Method for Charged Particle Beam Device, and Sign...

Plasma Processing Method And Plasma Processing Apparatus

Charged particle beam adjustment method and apparatus

Plasma processing method and plasma processing apparatus

Plasma processing method and plasma processing apparatus