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Katsumi Shibayama

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  • Hamamatsu, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method for manufacturing semiconductor substrate, method for manufa...
    • Patent number 12,187,607
    • Issue date Jan 7, 2025
    • Hamamatsu Photonics K.K.
    • Nao Inoue
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Light detection device
    • Patent number 12,169,143
    • Issue date Dec 17, 2024
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Mirror unit and optical module
    • Patent number 12,152,878
    • Issue date Nov 26, 2024
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Electrical inspection method
    • Patent number 12,123,799
    • Issue date Oct 22, 2024
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Back surface incident type semiconductor photo detection element
    • Patent number 12,021,104
    • Issue date Jun 25, 2024
    • Hamamatsu Photonics K.K.
    • Tomoya Taguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Damascene interconnect structure, actuator device, and method of ma...
    • Patent number 11,987,493
    • Issue date May 21, 2024
    • Hamamatsu Photonics K.K.
    • Daiki Suzuki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Light source unit and optical head
    • Patent number 11,953,733
    • Issue date Apr 9, 2024
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Suctioning method
    • Patent number 11,947,140
    • Issue date Apr 2, 2024
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
  • Information Patent Grant

    Mirror unit and optical module
    • Patent number 11,879,731
    • Issue date Jan 23, 2024
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Suction method
    • Patent number 11,865,701
    • Issue date Jan 9, 2024
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G02 - OPTICS
  • Information Patent Grant

    Light detection device
    • Patent number 11,835,388
    • Issue date Dec 5, 2023
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Light detection device
    • Patent number 11,796,391
    • Issue date Oct 24, 2023
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for manufacturing back surface incident type semiconductor p...
    • Patent number 11,764,236
    • Issue date Sep 19, 2023
    • Hamamatsu Photonics K.K.
    • Tomoya Taguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor light detection element
    • Patent number 11,664,405
    • Issue date May 30, 2023
    • Hamamatsu Photonics K.K.
    • Kazuto Ofuji
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Optical device
    • Patent number 11,629,947
    • Issue date Apr 18, 2023
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Mirror unit and optical module
    • Patent number 11,629,946
    • Issue date Apr 18, 2023
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Wafer inspection method and wafer
    • Patent number 11,624,902
    • Issue date Apr 11, 2023
    • Hamamatsu Photonics K.K.
    • Yumi Kuramoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mirror unit and optical module
    • Patent number 11,624,605
    • Issue date Apr 11, 2023
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Wafer
    • Patent number 11,609,420
    • Issue date Mar 21, 2023
    • Hamamatsu Photonics K.K.
    • Toshimitsu Kawai
    • G02 - OPTICS
  • Information Patent Grant

    Transportation method
    • Patent number 11,592,332
    • Issue date Feb 28, 2023
    • Hamamatsu Photonics K.K.
    • Hiroki Oyama
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Light module
    • Patent number 11,561,388
    • Issue date Jan 24, 2023
    • Hamamatsu Photonics K.K.
    • Tatsuya Sugimoto
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Transportation method
    • Patent number 11,555,740
    • Issue date Jan 17, 2023
    • Hamamatsu Photonics K.K.
    • Hiroki Oyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Optical detection device having adhesive member
    • Patent number 11,555,741
    • Issue date Jan 17, 2023
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Light detector
    • Patent number 11,519,785
    • Issue date Dec 6, 2022
    • Hamamatsu Photonics K.K.
    • Masahiro Yamazaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Optical filter system
    • Patent number 11,480,783
    • Issue date Oct 25, 2022
    • Hamamatsu Photonics K.K.
    • Helmut Teichmann
    • G02 - OPTICS
  • Information Patent Grant

    Method for manufacturing back surface incident type semiconductor p...
    • Patent number 11,450,695
    • Issue date Sep 20, 2022
    • Hamamatsu Photonics K.K.
    • Tomoya Taguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wafer
    • Patent number 11,448,869
    • Issue date Sep 20, 2022
    • Hamamatsu Photonics K.K.
    • Toshimitsu Kawai
    • G02 - OPTICS
  • Information Patent Grant

    Light detection device
    • Patent number 11,448,553
    • Issue date Sep 20, 2022
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G02 - OPTICS
  • Information Patent Grant

    Optical inspection device and optical inspection method
    • Patent number 11,422,059
    • Issue date Aug 23, 2022
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • G02 - OPTICS
  • Information Patent Grant

    Method for removing foreign matter and method for manufacturing opt...
    • Patent number 11,294,170
    • Issue date Apr 5, 2022
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents