Katsumi Sugisaki

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for measuring wavefront using diffraction grating...
- Patent number 10,571,340
- Issue date Feb 25, 2020
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and device for measuring wavefront using light-exit section...
- Patent number 10,288,489
- Issue date May 14, 2019
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and methods for surficial milling of selected regions on...
- Patent number 6,909,774
- Issue date Jun 21, 2005
- Nikon Corporation
- Tetsuya Oshino
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray-generation devices, X-ray microlithography apparatus comprisi...
- Patent number 6,507,641
- Issue date Jan 14, 2003
- Nikon Corporation
- Hiroyuki Kondo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20190219451
- Publication date Jul 18, 2019
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20150160073
- Publication date Jun 11, 2015
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
Multilayer-film mirrors for use in extreme UV optical systems, and...
- Publication number 20030081722
- Publication date May 1, 2003
- NIKON CORPORATION
- Noriaki Kandaka
- G02 - OPTICS
Information Patent Application
Apparatus and methods for surficial milling of selected regions on...
- Publication number 20030058986
- Publication date Mar 27, 2003
- NIKON CORPORATION
- Tetsuya Oshino
- B82 - NANO-TECHNOLOGY