Katsumi Suzuki

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Silicon carbide semiconductor device and method for manufacturing same
- Patent number 12,057,498
- Issue date Aug 6, 2024
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask defect repair apparatus and mask defect repair method
- Patent number 11,906,899
- Issue date Feb 20, 2024
- Hitachi High-Tech Science Corporation
- Yoshitomo Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Socket for inspection
- Patent number 11,821,915
- Issue date Nov 21, 2023
- Yamaichi Electronics Co., Ltd.
- Kouki Nakashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Kelvin contact for inspection, kelvin socket for inspection, and me...
- Patent number 11,536,743
- Issue date Dec 27, 2022
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Cylindrical member, contact probe and semiconductor inspection socket
- Patent number 11,531,060
- Issue date Dec 20, 2022
- Yamaichi Electronics, Co. Ltd.
- Takeyuki Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and inspecting socket including the same
- Patent number 11,360,118
- Issue date Jun 14, 2022
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
SiC epitaxial wafer and method for producing same
- Patent number 11,107,892
- Issue date Aug 31, 2021
- Showa Denko K.K.
- Keisuke Fukada
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Silicon carbide semiconductor device and method of manufacturing th...
- Patent number 11,049,966
- Issue date Jun 29, 2021
- Denso Corporation
- Akira Amano
- G01 - MEASURING TESTING
Information Patent Grant
Silicon carbide semiconductor device and method of manufacturing th...
- Patent number 10,790,201
- Issue date Sep 29, 2020
- Denso Corporation
- Akira Amano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device and manufacturing method therefor
- Patent number 10,784,335
- Issue date Sep 22, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of silicon carbide semiconductor device
- Patent number 10,748,780
- Issue date Aug 18, 2020
- Denso Corporation
- Shigeyuki Takagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film forming apparatus
- Patent number 10,745,824
- Issue date Aug 18, 2020
- NuFlare Technology, Inc.
- Kunihiko Suzuki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Silicon carbide semiconductor device and manufacturing method therefor
- Patent number 10,734,515
- Issue date Aug 4, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device and manufacturing method therefor
- Patent number 10,720,493
- Issue date Jul 21, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device and manufacturing method therefor
- Patent number 10,720,492
- Issue date Jul 21, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device
- Patent number 10,714,611
- Issue date Jul 14, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compound semiconductor device and production method for the same
- Patent number 10,643,851
- Issue date May 5, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compound semiconductor device and method for manufacturing the same
- Patent number 10,593,750
- Issue date Mar 17, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film forming apparatus, susceptor, and film forming method
- Patent number 10,584,417
- Issue date Mar 10, 2020
- NuFlare Technology, Inc.
- Hideki Ito
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for manufacturing compound semiconductor device and compound...
- Patent number 10,580,851
- Issue date Mar 3, 2020
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing compound semiconductor device including p-...
- Patent number 10,439,037
- Issue date Oct 8, 2019
- Denso Corporation
- Yuichi Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating mechanism including a movable element supported by electr...
- Patent number 9,748,051
- Issue date Aug 29, 2017
- Kabushiki Kaisha Toshiba
- Yutaka Maruyama
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Contact probe and semiconductor element socket provided with same
- Patent number 9,684,031
- Issue date Jun 20, 2017
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 9,660,046
- Issue date May 23, 2017
- Kabushiki Kaisha Toyota Chuo Kenkyusho
- Sachiko Aoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection probe and an IC socket with the same
- Patent number 9,588,140
- Issue date Mar 7, 2017
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Crosslinkable and foamable composition, crosslinked foam, and shoe...
- Patent number 9,493,623
- Issue date Nov 15, 2016
- ASAHI KASEI CHEMICALS CORPORATION
- Daisuke Shimizu
- A43 - FOOTWEAR
Information Patent Grant
Crosslinked composition, method for producing crosslinked compositi...
- Patent number 9,365,706
- Issue date Jun 14, 2016
- ASAHI KASEI CHEMICALS CORPORATION
- Daisuke Shimizu
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Contact probe and semiconductor device socket including contact probe
- Patent number 9,105,994
- Issue date Aug 11, 2015
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe
- Patent number D699607
- Issue date Feb 18, 2014
- Yamaichi Electronics Co., Ltd.
- Yuji Nakamura
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Thermally conductive material and thermally conductive sheet molded...
- Patent number 8,653,176
- Issue date Feb 18, 2014
- Asahi Kasei E-Materials Corporation
- Motonori Nakamichi
- F28 - HEAT EXCHANGE IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
TILING DISPLAY, UNIT PANEL GROUP, METHOD FOR PRODUCING TILING DISPL...
- Publication number 20250031543
- Publication date Jan 23, 2025
- AGC Inc.
- Kazuya TAKEMOTO
Information Patent Application
SELF-LUMINOUS DISPLAY DEVICE
- Publication number 20240414991
- Publication date Dec 12, 2024
- AGC Inc.
- Katsumi SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE AND INSPECTION SOCKET
- Publication number 20240353444
- Publication date Oct 24, 2024
- Yamaichi Electronics Co., Ltd.
- Seiya YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
DIODE, FIELD EFFECT TRANSISTOR HAVING THE DIODE, AND METHOD FOR MAN...
- Publication number 20240250164
- Publication date Jul 25, 2024
- DENSO CORPORATION
- Masahiro KUMITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSPARENT SUBSTRATE WITH MULTILAYER FILM AND IMAGE DISPLAY DEVICE
- Publication number 20230408731
- Publication date Dec 21, 2023
- AGC Inc.
- Keisuke KAWAI
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
ANTIGLARE FILM-PROVIDED TRANSPARENT SUBSTRATE AND PRODUCTION METHOD...
- Publication number 20230375753
- Publication date Nov 23, 2023
- AGC Inc.
- Katsumi SUZUKI
- G02 - OPTICS
Information Patent Application
ANTIGLARE FILM-PROVIDED TRANSPARENT SUBSTRATE AND PRODUCTION METHOD...
- Publication number 20230375752
- Publication date Nov 23, 2023
- AGC Inc.
- Katsumi SUZUKI
- G02 - OPTICS
Information Patent Application
TRANSPARENT SUBSTRATE WITH ANTI-REFLECTIVE FILM
- Publication number 20230144879
- Publication date May 11, 2023
- AGC Inc.
- Katsumi SUZUKI
- G02 - OPTICS
Information Patent Application
SOCKET FOR INSPECTION
- Publication number 20220155343
- Publication date May 19, 2022
- Yamaichi Electronics Co., Ltd.
- KOUKI NAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
KELVIN CONTACT FOR INSPECTION, KELVIN SOCKET FOR INSPECTION, AND ME...
- Publication number 20220074969
- Publication date Mar 10, 2022
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20210384343
- Publication date Dec 9, 2021
- DENSO CORPORATION
- YUICHI TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contact Probe and Inspecting Socket Including the Same
- Publication number 20210072284
- Publication date Mar 11, 2021
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Cylindrical Member, Contact Probe and Semiconductor Inspection Socket
- Publication number 20200393507
- Publication date Dec 17, 2020
- Yamaichi Electronics Co., Ltd.
- Takeyuki Suzuki
- G01 - MEASURING TESTING
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING TH...
- Publication number 20200381313
- Publication date Dec 3, 2020
- DENSO CORPORATION
- Akira AMANO
- G01 - MEASURING TESTING
Information Patent Application
MASK DEFECT REPAIR APPARATUS AND MASK DEFECT REPAIR METHOD
- Publication number 20200310246
- Publication date Oct 1, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshitomo NAKAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIC EPITAXIAL WAFER AND METHOD FOR PRODUCING SAME
- Publication number 20200083330
- Publication date Mar 12, 2020
- SHOWA DENKO K.K.
- Keisuke FUKADA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20190386131
- Publication date Dec 19, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20190386096
- Publication date Dec 19, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20190386095
- Publication date Dec 19, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20190386094
- Publication date Dec 19, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SiC EPITAXIAL WAFER AND METHOD FOR PRODUCING SAME
- Publication number 20190376206
- Publication date Dec 12, 2019
- SHOWA DENKO K.K.
- Keisuke FUKADA
- C30 - CRYSTAL GROWTH
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE
- Publication number 20190334030
- Publication date Oct 31, 2019
- DENSO CORPORATION
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SILICON CARBIDE SEMICONDUCTOR DEVICE
- Publication number 20190214264
- Publication date Jul 11, 2019
- DENSO CORPORATION
- Shigeyuki TAKAGI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING TH...
- Publication number 20190181239
- Publication date Jun 13, 2019
- DENSO CORPORATION
- Akira AMANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR DEVICE AND COMPOUND...
- Publication number 20190035883
- Publication date Jan 31, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOUND SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20190035882
- Publication date Jan 31, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOUND SEMICONDUCTOR DEVICE AND PRODUCTION METHOD FOR THE SAME
- Publication number 20190019680
- Publication date Jan 17, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR DEVICE
- Publication number 20190013392
- Publication date Jan 10, 2019
- Denso Corporation
- Yuichi TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILM FORMING APPARATUS
- Publication number 20180135203
- Publication date May 17, 2018
- NuFlare Technology, Inc.
- Kunihiko SUZUKI
- C30 - CRYSTAL GROWTH
Information Patent Application
FILM FORMING APPARATUS
- Publication number 20180135175
- Publication date May 17, 2018
- NuFlare Technology, Inc.
- Kunihiko SUZUKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Katsumi Suzuki

Person

Patents Grantslast 30 patents

Silicon carbide semiconductor device and method for manufacturing same

Mask defect repair apparatus and mask defect repair method

Socket for inspection

Kelvin contact for inspection, kelvin socket for inspection, and me...

Cylindrical member, contact probe and semiconductor inspection socket

Contact probe and inspecting socket including the same

SiC epitaxial wafer and method for producing same

Silicon carbide semiconductor device and method of manufacturing th...

Silicon carbide semiconductor device and method of manufacturing th...

Silicon carbide semiconductor device and manufacturing method therefor

Manufacturing method of silicon carbide semiconductor device

Film forming apparatus

Silicon carbide semiconductor device and manufacturing method therefor

Silicon carbide semiconductor device and manufacturing method therefor

Silicon carbide semiconductor device and manufacturing method therefor

Silicon carbide semiconductor device

Compound semiconductor device and production method for the same

Compound semiconductor device and method for manufacturing the same

Film forming apparatus, susceptor, and film forming method

Method for manufacturing compound semiconductor device and compound...

Method for manufacturing compound semiconductor device including p-...

Operating mechanism including a movable element supported by electr...

Contact probe and semiconductor element socket provided with same

Method of manufacturing semiconductor device

Inspection probe and an IC socket with the same

Crosslinkable and foamable composition, crosslinked foam, and shoe...

Crosslinked composition, method for producing crosslinked compositi...

Contact probe and semiconductor device socket including contact probe

Contact probe

Thermally conductive material and thermally conductive sheet molded...

Patents Applicationslast 30 patents

TILING DISPLAY, UNIT PANEL GROUP, METHOD FOR PRODUCING TILING DISPL...

SELF-LUMINOUS DISPLAY DEVICE

PROBE AND INSPECTION SOCKET

DIODE, FIELD EFFECT TRANSISTOR HAVING THE DIODE, AND METHOD FOR MAN...

TRANSPARENT SUBSTRATE WITH MULTILAYER FILM AND IMAGE DISPLAY DEVICE

ANTIGLARE FILM-PROVIDED TRANSPARENT SUBSTRATE AND PRODUCTION METHOD...

ANTIGLARE FILM-PROVIDED TRANSPARENT SUBSTRATE AND PRODUCTION METHOD...

TRANSPARENT SUBSTRATE WITH ANTI-REFLECTIVE FILM

SOCKET FOR INSPECTION

KELVIN CONTACT FOR INSPECTION, KELVIN SOCKET FOR INSPECTION, AND ME...

SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

Contact Probe and Inspecting Socket Including the Same

Cylindrical Member, Contact Probe and Semiconductor Inspection Socket

SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING TH...

MASK DEFECT REPAIR APPARATUS AND MASK DEFECT REPAIR METHOD

SIC EPITAXIAL WAFER AND METHOD FOR PRODUCING SAME

SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

SiC EPITAXIAL WAFER AND METHOD FOR PRODUCING SAME

SILICON CARBIDE SEMICONDUCTOR DEVICE

MANUFACTURING METHOD OF SILICON CARBIDE SEMICONDUCTOR DEVICE

SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING TH...

METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR DEVICE AND COMPOUND...

COMPOUND SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

COMPOUND SEMICONDUCTOR DEVICE AND PRODUCTION METHOD FOR THE SAME

METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR DEVICE

FILM FORMING APPARATUS

FILM FORMING APPARATUS