Katsumichi Ueyanagi

Person

Matsumoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor apparatus
- Patent number 8,779,584
- Issue date Jul 15, 2014
- Fuji Electric Co., Ltd.
- Toshiyuki Yokomae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor pressure sensor
- Patent number 8,304,847
- Issue date Nov 6, 2012
- Fuji Electric Co., Ltd.
- Toshiaki Kaminaga
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,030,749
- Issue date Oct 4, 2011
- Fuji Electric Systems Co., Ltd.
- Shin Soyano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with lead frame including conductor plates arr...
- Patent number 7,705,443
- Issue date Apr 27, 2010
- Fuji Electric Device Technology Co., Ltd.
- Toshiyuki Yokomae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated sensor including a pressure sensor and a temperature sensor
- Patent number 7,574,919
- Issue date Aug 18, 2009
- Fuji Electric Device Technology Co., Ltd.
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor apparatus and pressure sensor housing
- Patent number 7,571,652
- Issue date Aug 11, 2009
- Fuji Electric Device Technology Co., Ltd.
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Signal amplifier circuit with a limiting voltage device
- Patent number 7,525,389
- Issue date Apr 28, 2009
- Fuji Electric Device Technology Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensing device incorporating pressure sensing chip in resi...
- Patent number 7,412,894
- Issue date Aug 19, 2008
- Fuji Electric Device Technology Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor device and pressure sensor cell thereof
- Patent number 7,370,536
- Issue date May 13, 2008
- Fuji Electric Device Technology Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Over-voltage protection circuit
- Patent number 7,274,543
- Issue date Sep 25, 2007
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Pressure detecting apparatus
- Patent number 7,234,358
- Issue date Jun 26, 2007
- Fuji Electric Device Technology Co., Ltd.
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor physical quantity sensing device
- Patent number 7,180,798
- Issue date Feb 20, 2007
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Polysilicon resistor semiconductor device
- Patent number 7,119,657
- Issue date Oct 10, 2006
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Open-circuit failure detection circuit
- Patent number 7,046,013
- Issue date May 16, 2006
- Fuji Electric Co., Ltd.
- Katsuyuki Uematsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Physical value detecting apparatus and housing for physical value d...
- Patent number 7,004,035
- Issue date Feb 28, 2006
- Fuji Electric Device Technology Co., Ltd.
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor physical quantity sensor with improved noise resistance
- Patent number 6,962,081
- Issue date Nov 8, 2005
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Container for semiconductor sensor, manufacturing method therefor,...
- Patent number 6,747,346
- Issue date Jun 8, 2004
- Fuji Electric Co., Ltd.
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Layout of semiconductor integrated circuit
- Patent number 6,684,371
- Issue date Jan 27, 2004
- Fuji Electric Co., Ltd.
- Katsuyuki Uematsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having an integral protection circuit
- Patent number 6,680,512
- Issue date Jan 20, 2004
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,632,697
- Issue date Oct 14, 2003
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor and pressure sensor housing having a protective por...
- Patent number 6,604,430
- Issue date Aug 12, 2003
- Fuji Electric Co., Ltd.
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,564,634
- Issue date May 20, 2003
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,526,827
- Issue date Mar 4, 2003
- Fuki Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,494,092
- Issue date Dec 17, 2002
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,446,507
- Issue date Sep 10, 2002
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor structure and method of manufacturing the same
- Patent number 6,346,735
- Issue date Feb 12, 2002
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,332,359
- Issue date Dec 25, 2001
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a semiconductor acceleration sensor
- Patent number 5,987,921
- Issue date Nov 23, 1999
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor accelerometer including strain gauges forming a wheat...
- Patent number 5,827,967
- Issue date Oct 27, 1998
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor acceleration sensor and testing method thereof
- Patent number 5,760,290
- Issue date Jun 2, 1998
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHYSICAL QUANTITY SENSING APPARATUS HAVING AN INTERNAL CIRCUIT, A F...
- Publication number 20100109647
- Publication date May 6, 2010
- Fuji Electric Device Technology Co., LTD.
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20090140414
- Publication date Jun 4, 2009
- Fuji Electric Device Technology Co., Ltd.
- Shin Soyano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20080150102
- Publication date Jun 26, 2008
- Fuji Electric Device Technology Co., LTD.
- Toshiyuki Yokomae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRESSURE SENSOR APPARATUS AND PRESSURE SENSOR HOUSING
- Publication number 20080110273
- Publication date May 15, 2008
- Fuji Electric Device Technology Co., LTD.
- Kazunori SAITO
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED SENSOR INCLUDING A PRESSURE SENSOR AND A TEMPERATURE SENSOR
- Publication number 20080110268
- Publication date May 15, 2008
- Fuji Electric Device Technology Co., LTD.
- Kazunori SAITO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor apparatus
- Publication number 20080087994
- Publication date Apr 17, 2008
- Fuji Electric Device Technology Co., LTD.
- Toshiyuki Yokomae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal amplifier circuit
- Publication number 20070290761
- Publication date Dec 20, 2007
- FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR APPARATUS AND PHYSICAL QUANTITY SENSING APPARATUS
- Publication number 20060244101
- Publication date Nov 2, 2006
- Fuji Electric Device Technology Co., LTD.
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and temperature detection method using the same
- Publication number 20060238186
- Publication date Oct 26, 2006
- Fuji Electric Device Technology Co., LTD.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor device and pressure sensor cell thereof
- Publication number 20060213276
- Publication date Sep 28, 2006
- Fuji Electric Device Technology Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor device and cell thereof
- Publication number 20050087020
- Publication date Apr 28, 2005
- Fuji Electric Device Technology Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Physical value detecting apparatus and housing for physical value d...
- Publication number 20050016289
- Publication date Jan 27, 2005
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor physical quantity sensing device
- Publication number 20040027872
- Publication date Feb 12, 2004
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Over-voltage protection circuit
- Publication number 20030214769
- Publication date Nov 20, 2003
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Open-circuit failure detection circuit
- Publication number 20030197513
- Publication date Oct 23, 2003
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Application
Overvoltage protection circuit
- Publication number 20020186518
- Publication date Dec 12, 2002
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Container for semiconductor sensor, manufacturing method therefor,...
- Publication number 20020180019
- Publication date Dec 5, 2002
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor and pressure sensor housing having a protective por...
- Publication number 20020178829
- Publication date Dec 5, 2002
- Kazunori Saito
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having an integral protection circuit
- Publication number 20020175425
- Publication date Nov 28, 2002
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Polysilicon resistor semiconductor device
- Publication number 20020175379
- Publication date Nov 28, 2002
- Katsumichi Ueyanagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor physical quantity sensing device
- Publication number 20020149984
- Publication date Oct 17, 2002
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Layout of semiconductor integrated circuit
- Publication number 20020152448
- Publication date Oct 17, 2002
- Katsuyuki Uematsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor physical quantity sensor
- Publication number 20020144554
- Publication date Oct 10, 2002
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20020127822
- Publication date Sep 12, 2002
- Katsumichi Ueyanagi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor sensor chip and method for producing the chip, and se...
- Publication number 20020017137
- Publication date Feb 14, 2002
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor sensor chip and method for producing the chip, and se...
- Publication number 20020017138
- Publication date Feb 14, 2002
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor sensor chip and method for producing the chip, and se...
- Publication number 20020011110
- Publication date Jan 31, 2002
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor sensor chip and method for producing the chip, and se...
- Publication number 20020007678
- Publication date Jan 24, 2002
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor sensor chip and method for producing the chip, and se...
- Publication number 20020007679
- Publication date Jan 24, 2002
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor sensor chip, method of manufacturing the same, and se...
- Publication number 20010040262
- Publication date Nov 15, 2001
- Shinji Uchida
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Katsumichi Ueyanagi

Person

Patents Grantslast 30 patents

Semiconductor apparatus

Semiconductor pressure sensor

Semiconductor device

Semiconductor device with lead frame including conductor plates arr...

Integrated sensor including a pressure sensor and a temperature sensor

Pressure sensor apparatus and pressure sensor housing

Signal amplifier circuit with a limiting voltage device

Pressure sensing device incorporating pressure sensing chip in resi...

Pressure sensor device and pressure sensor cell thereof

Over-voltage protection circuit

Pressure detecting apparatus

Semiconductor physical quantity sensing device

Polysilicon resistor semiconductor device

Open-circuit failure detection circuit

Physical value detecting apparatus and housing for physical value d...

Semiconductor physical quantity sensor with improved noise resistance

Container for semiconductor sensor, manufacturing method therefor,...

Layout of semiconductor integrated circuit

Semiconductor device having an integral protection circuit

Semiconductor sensor chip and method for producing the chip, and se...

Pressure sensor and pressure sensor housing having a protective por...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor structure and method of manufacturing the same

Semiconductor sensor chip and method for producing the chip, and se...

Method for making a semiconductor acceleration sensor

Semiconductor accelerometer including strain gauges forming a wheat...

Semiconductor acceleration sensor and testing method thereof

Patents Applicationslast 30 patents

PHYSICAL QUANTITY SENSING APPARATUS HAVING AN INTERNAL CIRCUIT, A F...

Semiconductor device

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

PRESSURE SENSOR APPARATUS AND PRESSURE SENSOR HOUSING

INTEGRATED SENSOR INCLUDING A PRESSURE SENSOR AND A TEMPERATURE SENSOR

Semiconductor apparatus

Signal amplifier circuit

SEMICONDUCTOR APPARATUS AND PHYSICAL QUANTITY SENSING APPARATUS

Semiconductor device and temperature detection method using the same

Pressure sensor device and pressure sensor cell thereof

Pressure sensor device and cell thereof

Physical value detecting apparatus and housing for physical value d...

Semiconductor physical quantity sensing device

Over-voltage protection circuit

Open-circuit failure detection circuit

Overvoltage protection circuit

Container for semiconductor sensor, manufacturing method therefor,...

Pressure sensor and pressure sensor housing having a protective por...

Semiconductor device having an integral protection circuit

Polysilicon resistor semiconductor device

Semiconductor physical quantity sensing device

Layout of semiconductor integrated circuit

Semiconductor physical quantity sensor

Semiconductor device and method of manufacturing the same

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip, method of manufacturing the same, and se...