TREA

Katsunori YAMAGISHI

Follow

Person

  • Nagano-shi, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe guide plate and probe device
    • Patent number 10,309,988
    • Issue date Jun 4, 2019
    • Shinko Electric Industries Co., Ltd.
    • Yuichiro Shimizu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor inspecting device
    • Patent number 7,884,632
    • Issue date Feb 8, 2011
    • Shinko Electric Electric Industries Co., Ltd.
    • Akinori Shiraishi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE GUIDE PLATE AND PROBE DEVICE
    • Publication number 20170205445
    • Publication date Jul 20, 2017
    • Shinko Electric Industries Co., Ltd.
    • Yuichiro Shimizu
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR INSPECTING DEVICE
    • Publication number 20090206861
    • Publication date Aug 20, 2009
    • SHINKO ELECTRIC INDUSTRIES, CO., LTD.
    • Akinori SHIRAISHI
    • G01 - MEASURING TESTING