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Katsuo Oki

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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor inspection device
    • Patent number 11,719,746
    • Issue date Aug 8, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Masaaki Komori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor inspection device and probe unit
    • Patent number 11,513,138
    • Issue date Nov 29, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masaaki Komori
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Dynamic response analysis prober device
    • Patent number 10,782,340
    • Issue date Sep 22, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Masaaki Komori
    • G02 - OPTICS
  • Information Patent Grant

    Inspection device
    • Patent number 8,816,712
    • Issue date Aug 26, 2014
    • Hitachi High-Technologies Corporation
    • Mitsuhiro Nakamura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Semiconductor Inspection Device
    • Publication number 20210270891
    • Publication date Sep 2, 2021
    • Hitachi High-Tech Corporation
    • Masaaki KOMORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor Inspection Device and Probe Unit
    • Publication number 20210263075
    • Publication date Aug 26, 2021
    • Hitachi High-Tech Corporation
    • Masaaki KOMORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Dynamic Response Analysis Prober Device
    • Publication number 20180299504
    • Publication date Oct 18, 2018
    • Hitachi High-Technologies Corporation
    • Masaaki KOMORI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INSPECTION DEVICE
    • Publication number 20110140729
    • Publication date Jun 16, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuhiro Nakamura
    • G01 - MEASURING TESTING