Katsuo Ooki

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Kasama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Specimen inspection equipment and how to make the electron beam abs...
- Patent number 8,178,840
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Tomoharu Obuki
- G01 - MEASURING TESTING
Information Patent Grant
Specimen inspection equipment and how to make electron beam absorbe...
- Patent number 7,663,104
- Issue date Feb 16, 2010
- Hitachi High-Technologies Corporation
- Tomoharu Obuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
- Publication number 20100116986
- Publication date May 13, 2010
- Hitachi High-Technologies Corporation
- Tomoharu OBUKI
- G01 - MEASURING TESTING
Information Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
- Publication number 20080203297
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Tomoharu OBUKI
- G01 - MEASURING TESTING