Katsuo YASUTA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Prober
- Patent number 11,428,727
- Issue date Aug 30, 2022
- Kabushiki Kaisha Nihon Micronics
- Katsuo Yasuta
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly for inspecting power semiconductor devices and inspe...
- Patent number 9,146,256
- Issue date Sep 29, 2015
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo Yasuta
- G01 - MEASURING TESTING
Information Patent Grant
Chip stack device testing method, chip stack device rearranging uni...
- Patent number 9,097,761
- Issue date Aug 4, 2015
- Kabushiki Kaisha Nihon Micronics
- Katsuo Yasuta
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for semiconductor devices and chuck stage for...
- Patent number 9,069,008
- Issue date Jun 30, 2015
- Kabushiki Kaisha Nihon Micronics
- Katsuo Yasuta
- G01 - MEASURING TESTING
Information Patent Grant
Wafer prober for semiconductor inspection and inspection method
- Patent number 8,471,586
- Issue date Jun 25, 2013
- Kabushiki Kaisha Nihon Micronics
- Kenichi Washio
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,278,965
- Issue date Oct 2, 2012
- Kabushiki Kaisha Nihon Micronics
- Kenichi Washio
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a semiconductor wafer and apparatus thereof
- Patent number 7,719,300
- Issue date May 18, 2010
- Kabushiki Kaisha Nihon Micronics
- Kenichi Washio
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBER
- Publication number 20210156901
- Publication date May 27, 2021
- Kabushiki Kaisha Nihon Micronics
- Katsuo YASUTA
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY FOR INSPECTING POWER SEMICONDUCTOR DEVICES AND INSPE...
- Publication number 20130141127
- Publication date Jun 6, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo YASUTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS FOR SEMICONDUCTOR DEVICES AND CHUCK STAGE USED...
- Publication number 20130141132
- Publication date Jun 6, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo YASUTA
- G01 - MEASURING TESTING
Information Patent Application
CHIP STACK DEVICE TESTING METHOD, CHIP STACK DEVICE REARRANGING UNI...
- Publication number 20120126844
- Publication date May 24, 2012
- Kabushiki Kaisha Nihon Micronics
- Katsuo YASUTA
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBER FOR SEMICONDUCTOR INSPECTION AND INSPECTION METHOD
- Publication number 20110018564
- Publication date Jan 27, 2011
- KABUSHIKI KAISHA NIHON MICRONCS
- Kenichi WASHIO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20100289514
- Publication date Nov 18, 2010
- Kabushiki Kaisha Nihon Micronics
- Kenichi WASHIO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A SEMICONDUCTOR WAFER AND APPARATUS THEREOF
- Publication number 20080224723
- Publication date Sep 18, 2008
- Kabushiki Kaisha Nihon Micronics
- Kenichi Washio
- G01 - MEASURING TESTING

Katsuo YASUTA

Person

Patents Grantslast 30 patents

Prober

Probe assembly for inspecting power semiconductor devices and inspe...

Chip stack device testing method, chip stack device rearranging uni...

Inspection apparatus for semiconductor devices and chuck stage for...

Wafer prober for semiconductor inspection and inspection method

Inspection apparatus

Method for testing a semiconductor wafer and apparatus thereof

Patents Applicationslast 30 patents

PROBER

PROBE ASSEMBLY FOR INSPECTING POWER SEMICONDUCTOR DEVICES AND INSPE...

INSPECTION APPARATUS FOR SEMICONDUCTOR DEVICES AND CHUCK STAGE USED...

CHIP STACK DEVICE TESTING METHOD, CHIP STACK DEVICE REARRANGING UNI...

WAFER PROBER FOR SEMICONDUCTOR INSPECTION AND INSPECTION METHOD

INSPECTION APPARATUS

METHOD FOR TESTING A SEMICONDUCTOR WAFER AND APPARATUS THEREOF