Katsura OTAKI

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Kamakura-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for measuring wavefront using diffraction grating...
- Patent number 10,571,340
- Issue date Feb 25, 2020
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and device for measuring wavefront using light-exit section...
- Patent number 10,288,489
- Issue date May 14, 2019
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Template manufacturing method, template inspecting method and inspe...
- Patent number 8,807,978
- Issue date Aug 19, 2014
- Nikon Corporation
- Soichi Owa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20190219451
- Publication date Jul 18, 2019
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20150160073
- Publication date Jun 11, 2015
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
TEMPLATE MANUFACTURING METHOD, TEMPLATE INSPECTING METHOD AND INSPE...
- Publication number 20110272382
- Publication date Nov 10, 2011
- Nikon Corporation
- Soichi OWA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Point diffraction interferometer, manufacturing method for reflecti...
- Publication number 20020044287
- Publication date Apr 18, 2002
- NIKON CORPORATION
- Katsura Otaki
- G01 - MEASURING TESTING