Katsura Takaguchi

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 11,610,754
- Issue date Mar 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining irradiation conditions for charged particle...
- Patent number 11,232,929
- Issue date Jan 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample observation method using...
- Patent number 11,183,362
- Issue date Nov 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20240128049
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Katsura TAKAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220013326
- Publication date Jan 13, 2022
- Hitachi High-Tech Corporation
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Determining Irradiation Conditions for Charged Particle...
- Publication number 20210027981
- Publication date Jan 28, 2021
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING...
- Publication number 20200294764
- Publication date Sep 17, 2020
- Hitachi High-Tech Corporation
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS