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Katsushi Ohta
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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Disk device and disk device control method
Patent number
10,684,952
Issue date
Jun 16, 2020
Kabushiki Kaisha Toshiba
Kimiyasu Aida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Disk device and data recording method
Patent number
9,053,746
Issue date
Jun 9, 2015
Kabushiki Kaisha Toshiba
Kenji Ogawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Storage apparatus, control method, and control device which can be...
Patent number
7,818,556
Issue date
Oct 19, 2010
Toshiba Storage Device Corporation
Hirotaka Iima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light receiving module and light receiving method with reduced pola...
Patent number
6,560,003
Issue date
May 6, 2003
Ando Electric Co., Ltd.
Fumio Akikuni
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic probe
Patent number
6,507,014
Issue date
Jan 14, 2003
Ando Electric Co. Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic sampling probe and measuring method using the same
Patent number
6,469,528
Issue date
Oct 22, 2002
Ando Electric Co., Ltd.
Fumio Akikuni
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic sampling probe and a method for adjusting the same
Patent number
6,445,198
Issue date
Sep 3, 2002
Ando Electric Co., Ltd.
Fumio Akikuni
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-insensitive electro-optic probe
Patent number
6,429,669
Issue date
Aug 6, 2002
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic probe
Patent number
6,410,906
Issue date
Jun 25, 2002
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Probe for electro-optic sampling oscilloscope
Patent number
6,407,561
Issue date
Jun 18, 2002
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic sampling probe comprising photodiodes insulated from...
Patent number
6,403,946
Issue date
Jun 11, 2002
Ando Electric Co., Ltd.
Fumio Akikuni
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic sampling prober
Patent number
6,388,454
Issue date
May 14, 2002
Ando Electric Co., Ltd.
Fumio Akikuni
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical probe for oscilloscope measuring signal waveform
Patent number
6,369,562
Issue date
Apr 9, 2002
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electrooptic probe
Patent number
6,348,787
Issue date
Feb 19, 2002
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electrooptic probe
Patent number
6,342,783
Issue date
Jan 29, 2002
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic probe
Patent number
6,337,565
Issue date
Jan 8, 2002
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic sampling probe having unit for adjusting quantity of...
Patent number
6,297,651
Issue date
Oct 2, 2001
Ando Electric Co., Ltd.
Fumio Akikuni
G01 - MEASURING TESTING
Information
Patent Grant
Electrooptic probe
Patent number
6,297,650
Issue date
Oct 2, 2001
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Probe for electro-optic sampling oscilloscope
Patent number
6,288,531
Issue date
Sep 11, 2001
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic probe
Patent number
6,166,845
Issue date
Dec 26, 2000
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Grant
Variable wavelength laser device
Patent number
5,943,349
Issue date
Aug 24, 1999
Ando Electric Co., Ltd.
Katsushi Ohta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Variable wavelength laser light source
Patent number
5,936,982
Issue date
Aug 10, 1999
Ando Electric Co., Ltd.
Katsushi Ohta
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DISK DEVICE AND DISK DEVICE CONTROL METHOD
Publication number
20190286565
Publication date
Sep 19, 2019
Kabushiki Kaisha Toshiba
Kimiyasu Aida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DISK APPARATUS AND CONTROL METHOD
Publication number
20160170891
Publication date
Jun 16, 2016
Kabushiki Kaisha Toshiba
Michio Yamamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DISK DEVICE AND DATA RECORDING METHOD
Publication number
20150085394
Publication date
Mar 26, 2015
Kabushiki Kaisha Toshiba
Kenji OGAWA
G11 - INFORMATION STORAGE
Information
Patent Application
STORAGE APPARATUS AND OUTPUT SIGNAL GENERATION CIRCUIT
Publication number
20100125685
Publication date
May 20, 2010
Fujitsu Limited
Katsushi Ohta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Storage apparatus, control method, and control device
Publication number
20080126784
Publication date
May 29, 2008
FUJITSU LIMITED
Hirotaka Iima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Storage apparatus, control method, and control device
Publication number
20080052506
Publication date
Feb 28, 2008
FUJITSU LIMITED
Hirotaka Iima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Information processor and program preparation method
Publication number
20060224842
Publication date
Oct 5, 2006
FUJITSU LIMITED
Hiroyuki Suto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electro-optic probe
Publication number
20020092975
Publication date
Jul 18, 2002
AKISHIGE ITO
G01 - MEASURING TESTING
Information
Patent Application
ELECTRO-OPTIC SAMPLING PROBE AND MEASURING METHOD USING THE SAME
Publication number
20020030500
Publication date
Mar 14, 2002
FUMIO AKIKUNI
G01 - MEASURING TESTING
Information
Patent Application
Electro-optic sampling probe
Publication number
20020017913
Publication date
Feb 14, 2002
Toshiyuki Yagi
G01 - MEASURING TESTING
Information
Patent Application
ELECTRO-OPTICAL PROBE FOR OSCILLOSCOPE MEASURING SIGNAL WAVEFORM
Publication number
20020011830
Publication date
Jan 31, 2002
AKISHIGE ITO
G01 - MEASURING TESTING
Information
Patent Application
Light receiving module and light receiving method with reduced pola...
Publication number
20010024331
Publication date
Sep 27, 2001
Fumio Akikuni
G01 - MEASURING TESTING
Information
Patent Application
Electro-optic probe
Publication number
20010022340
Publication date
Sep 20, 2001
Akishige Ito
G01 - MEASURING TESTING