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Katsushi Takahashi

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Specimen preprocessing system
    • Patent number 8,309,026
    • Issue date Nov 13, 2012
    • Hitachi High-Technologies Corporation
    • Naoto Tsujimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample rack handling system
    • Patent number 6,764,650
    • Issue date Jul 20, 2004
    • Hitachi, Ltd.
    • Katsushi Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample rack handling system
    • Patent number 6,337,050
    • Issue date Jan 8, 2002
    • Hitachi, Ltd.
    • Katsushi Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample handling system
    • Patent number 6,290,907
    • Issue date Sep 18, 2001
    • Hitachi, Ltd.
    • Katsushi Takahashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SPECIMEN PREPROCESSING SYSTEM
    • Publication number 20090035185
    • Publication date Feb 5, 2009
    • Naoto TSUJIMURA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Sample rack handling system
    • Publication number 20020028157
    • Publication date Mar 7, 2002
    • Katsushi Takahashi
    • G01 - MEASURING TESTING