Katsushige Tsuno

Person

Akisima, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and combined illumination lens
- Patent number 7,601,957
- Issue date Oct 13, 2009
- National University Corporation Kyoto Institute of Technology
- Hisamitsu Endoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter and electron microscope
- Patent number 6,960,763
- Issue date Nov 1, 2005
- Jeol Ltd.
- G. Martinez Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter and electron microscope using same
- Patent number 6,844,548
- Issue date Jan 18, 2005
- Jeol Ltd.
- G. Martinez Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter
- Patent number 6,624,412
- Issue date Sep 23, 2003
- Jeol Ltd.
- Michiyoshi Tanaka
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Monochrometer for electron beam
- Patent number 6,495,826
- Issue date Dec 17, 2002
- Jeol, Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic energy filter
- Patent number 6,441,378
- Issue date Aug 27, 2002
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter and electron microscope using same
- Patent number 6,407,384
- Issue date Jun 18, 2002
- Jeol Ltd.
- Michiyoshi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope equipped with energy filter
- Patent number 6,323,485
- Issue date Nov 27, 2001
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Omega energy filter
- Patent number 6,307,205
- Issue date Oct 23, 2001
- Jeol Ltd.
- Katsushige Tsuno
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Transmission electron microscope having energy filter
- Patent number 6,140,645
- Issue date Oct 31, 2000
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 6,111,253
- Issue date Aug 29, 2000
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter
- Patent number 6,097,028
- Issue date Aug 1, 2000
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Omega-type energy filter
- Patent number 5,955,732
- Issue date Sep 21, 1999
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Omega-type energy filter
- Patent number 5,811,801
- Issue date Sep 22, 1998
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential phase contrast scanning transmission electron microscope
- Patent number 5,004,918
- Issue date Apr 2, 1991
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 4,585,942
- Issue date Apr 29, 1986
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 4,520,264
- Issue date May 28, 1985
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron lens
- Patent number 4,468,563
- Issue date Aug 28, 1984
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron lens equipped with three magnetic pole pieces
- Patent number 4,450,357
- Issue date May 22, 1984
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron lens equipped with three magnetic pole pieces
- Patent number 4,412,132
- Issue date Oct 25, 1983
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron lens equipped with three magnetic pole pieces
- Patent number 4,384,208
- Issue date May 17, 1983
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Combined Illumination Lens
- Publication number 20080149833
- Publication date Jun 26, 2008
- Hisamitsu Endoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Energy filter and electron microscope
- Publication number 20040144920
- Publication date Jul 29, 2004
- JEOL Ltd.
- G. Martinez Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wien filter and electron microscope using same
- Publication number 20030226975
- Publication date Dec 11, 2003
- JEOL Ltd.
- G. Martinez Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy filter
- Publication number 20020017614
- Publication date Feb 14, 2002
- Michiyoshi Tanaka
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Monochrometer for electron beam
- Publication number 20010052744
- Publication date Dec 20, 2001
- JEOL Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS

Katsushige Tsuno

Person

Patents Grantslast 30 patents

Electron microscope and combined illumination lens

Energy filter and electron microscope

Wien filter and electron microscope using same

Energy filter

Monochrometer for electron beam

Magnetic energy filter

Energy filter and electron microscope using same

Electron microscope equipped with energy filter

Omega energy filter

Transmission electron microscope having energy filter

Transmission electron microscope

Energy filter

Omega-type energy filter

Omega-type energy filter

Differential phase contrast scanning transmission electron microscope

Transmission electron microscope

Electron microscope

Electron lens

Electron lens equipped with three magnetic pole pieces

Electron lens equipped with three magnetic pole pieces

Electron lens equipped with three magnetic pole pieces

Patents Applicationslast 30 patents

Electron Microscope and Combined Illumination Lens

Energy filter and electron microscope

Wien filter and electron microscope using same

Energy filter

Monochrometer for electron beam