Katsutoshi Bito

Person

  • Tokyo, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE AND FAULT DETECTING METHOD

    • Publication number 20170003337
    • Publication date Jan 5, 2017
    • RENESAS ELECTRONICS CORPORATION
    • Katsutoshi BITO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE

    • Publication number 20100259201
    • Publication date Oct 14, 2010
    • RENESAS TECHNOLOGY CORP.
    • Makoto KAWANO
    • H01 - BASIC ELECTRIC ELEMENTS