Katsutoshi KABETA

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Himeji-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Microchip testing device
- Patent number 7,636,162
- Issue date Dec 22, 2009
- Ushiodenki Kabushiki Kaisha
- Yoshimasa Ogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROCHIP TESTING DEVICE
- Publication number 20080062423
- Publication date Mar 13, 2008
- Ushiodenki Kabushiki Kaisha
- Yoshimasa OGAWA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL