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Katsutoshi Nonaka
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Shizuoka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Time of flight mass spectrometer and charged particle detector ther...
Patent number
8,294,089
Issue date
Oct 23, 2012
Hamamatsu Photonics K.K.
Akio Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Micro channel plate assembly
Patent number
7,982,172
Issue date
Jul 19, 2011
Hamamatsu Photonics K.K.
Akio Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Curved surface shape inspection method, fiber optical block, and cu...
Patent number
7,679,734
Issue date
Mar 16, 2010
Hamamatsu Photonics K.K.
Katsutoshi Nonaka
G01 - MEASURING TESTING
Information
Patent Grant
Charged-particle detecting apparatus
Patent number
7,655,891
Issue date
Feb 2, 2010
Hamamatsu Photonics K.K.
Akio Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scintillator panel, radiation detector, and method of making scinti...
Patent number
6,781,131
Issue date
Aug 24, 2004
Hamamatsu Photonics K.K.
Yutaka Kusuyama
G01 - MEASURING TESTING
Information
Patent Grant
Scintillator panel, radiation image sensor, and method of making sc...
Patent number
6,635,877
Issue date
Oct 21, 2003
Hamamatsu Photonics K.K.
Yutaka Kusuyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TIME OF FLIGHT MASS SPECTROMETER AND CHARGED PARTICLE DETECTOR THER...
Publication number
20090236517
Publication date
Sep 24, 2009
HAMAMATSU PHOTONICS K. K.
Akio SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICRO CHANNEL PLATE ASSEMBLY
Publication number
20090230286
Publication date
Sep 17, 2009
HAMAMATSU PHOTONICS K. K.
Akio SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged-particle detecting apparatus
Publication number
20080230686
Publication date
Sep 25, 2008
Hamamatsu Photonics K.K.
Akio Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Curved Surface Shape Inspection Method, Fiber Optical Block, and Cu...
Publication number
20070216911
Publication date
Sep 20, 2007
Katsutoshi Nonaka
G01 - MEASURING TESTING
Information
Patent Application
Scintillator panel, radiation detector, and method of making scinti...
Publication number
20020005489
Publication date
Jan 17, 2002
Hamamatsu Photonics K.K.
Yutaka Kasuyama
G01 - MEASURING TESTING
Information
Patent Application
Scintillator panel, radiation image sensor, and method of making sc...
Publication number
20010054694
Publication date
Dec 27, 2001
Hamamatsu Photonics K.K.
Yutaka Kusuyama
G01 - MEASURING TESTING