Katsuya Furue

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device capable of shortening test time and suppressin...
- Patent number 6,962,827
- Issue date Nov 8, 2005
- Renesas Technology Corp.
- Katsuya Furue
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,900,691
- Issue date May 31, 2005
- Renesas Technology Corp.
- Katsuya Furue
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing semiconductor devices using improv...
- Patent number 6,646,461
- Issue date Nov 11, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kazushi Sugiura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit
- Publication number 20050046473
- Publication date Mar 3, 2005
- RENESAS TECHNOLOGY CORP.
- Katsuya Furue
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing semiconductor devices
- Publication number 20020070746
- Publication date Jun 13, 2002
- Mitsubishi Denki Kabushiki Kaisha And Ryoden Semiconductor System Engineering...
- Kazushi Sugiura
- G01 - MEASURING TESTING