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Katsuya Suzuki

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SURFACE-DEFECT INSPECTION DEVICE
    • Publication number 20130314700
    • Publication date Nov 28, 2013
    • Hitachi High-Technologies Corporation
    • Katsuya SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION APPARATUS
    • Publication number 20130286385
    • Publication date Oct 31, 2013
    • Hitachi High-Technologies Corporation
    • Yusuke Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SURFACE-DEFECT INSPECTION DEVICE
    • Publication number 20120147363
    • Publication date Jun 14, 2012
    • Katsuya Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    PATTERN DEFECT INSPECTION METHOD AND APPARATUS
    • Publication number 20100021041
    • Publication date Jan 28, 2010
    • Hitachi High-Technologies Corporation
    • Shigeru Matsui
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    PATTERN DEFECT INSPECTION METHOD AND APPARATUS
    • Publication number 20090041335
    • Publication date Feb 12, 2009
    • Hitachi High-Technologies Corporation
    • Shigeru Matsui
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Pattern defect inspection method and apparatus
    • Publication number 20080279445
    • Publication date Nov 13, 2008
    • Hitachi High-Technologies Corporation
    • Shigeru Matsui
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Pattern defect inspection method and apparatus
    • Publication number 20050117796
    • Publication date Jun 2, 2005
    • Shigeru Matsui
    • G06 - COMPUTING CALCULATING COUNTING