Katsuyoshi Kirikoshi

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, semiconductor substrate and fabrication proce...
- Patent number 7,291,931
- Issue date Nov 6, 2007
- Fujitsu Limited
- Katsuyoshi Kirikoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, semiconductor substrate and fabrication proce...
- Patent number 7,033,904
- Issue date Apr 25, 2006
- Fujitsu Limited
- Katsuyoshi Kirikoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test photomask, flare evaluation method, and flare compensation method
- Patent number 6,986,973
- Issue date Jan 17, 2006
- Fujitsu Limited
- Teruyoshi Yao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device, semiconductor substrate and fabrication proce...
- Publication number 20060125101
- Publication date Jun 15, 2006
- FUJITSU LIMITED
- Katsuyoshi Kirikoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SUBSTRATE AND FABRICATION PROCE...
- Publication number 20060027926
- Publication date Feb 9, 2006
- FUJITSU LIMITED
- Katsuyoshi Kirikoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test photomask, flare evaluation method, and flare compensation method
- Publication number 20040023130
- Publication date Feb 5, 2004
- FUJITSU LIMITED
- Teruyoshi Yao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY