Katsuyoshi NAKASHIMA

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YOKOHAMA, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,879,055
- Issue date Nov 4, 2014
- Lasertec Corporation
- Hironobu Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
High speed pattern inspection method and system
- Patent number 5,900,941
- Issue date May 4, 1999
- Fujitsu Limited
- Takayoshi Matsuyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20140333921
- Publication date Nov 13, 2014
- Lasertec Corporation
- Hironobu SUZUKI
- G01 - MEASURING TESTING