Katsuyuki HASHIMOTO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning laser microscope
- Patent number 10,845,584
- Issue date Nov 24, 2020
- Olympus Corporation
- Katsuyuki Hashimoto
- G02 - OPTICS
Information Patent Grant
Laser scanning microscope
- Patent number 10,048,479
- Issue date Aug 14, 2018
- Olympus Corporation
- Katsuyuki Hashimoto
- G02 - OPTICS
Information Patent Grant
Laser microscope which expands the dynamic range of an intensity si...
- Patent number 9,625,696
- Issue date Apr 18, 2017
- Olympus Corporation
- Katsuyuki Hashimoto
- G02 - OPTICS
Information Patent Grant
Substrate processing apparatus and substrate housing method
- Patent number 7,747,343
- Issue date Jun 29, 2010
- Olympus Corporation
- Katsuyuki Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing apparatus and substrate processing system
- Patent number 7,369,237
- Issue date May 6, 2008
- Olympus Corporation
- Yasunori Ikeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for accessing frame memory within display panel d...
- Patent number 7,180,521
- Issue date Feb 20, 2007
- Pioneer Corporation
- Toshiaki Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer inspection apparatus
- Patent number 7,102,743
- Issue date Sep 5, 2006
- Olympus Corporation
- Haruyuki Tsuji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING LASER MICROSCOPE
- Publication number 20190187448
- Publication date Jun 20, 2019
- OLYMPUS CORPORATION
- Katsuyuki HASHIMOTO
- G02 - OPTICS
Information Patent Application
LASER SCANNING MICROSCOPE
- Publication number 20170102531
- Publication date Apr 13, 2017
- OLYMPUS CORPORATION
- Katsuyuki HASHIMOTO
- G02 - OPTICS
Information Patent Application
LASER MICROSCOPE
- Publication number 20160109694
- Publication date Apr 21, 2016
- OLYMPUS CORPORATION
- Katsuyuki HASHIMOTO
- G02 - OPTICS
Information Patent Application
VISUAL INSPECTION APPARATUS
- Publication number 20090097737
- Publication date Apr 16, 2009
- OLYMPUS CORPORATION
- Katsuyuki HASHIMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Visual inspection apparatus
- Publication number 20070222976
- Publication date Sep 27, 2007
- OLYMPUS CORPORATION
- Katsuyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
Substrate processing apparatus and substrate housing method
- Publication number 20060215152
- Publication date Sep 28, 2006
- OLYMPUS CORPORATION
- Katsuyuki Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate processing apparatus and substrate processing system
- Publication number 20060008134
- Publication date Jan 12, 2006
- OLYMPUS CORPORATION
- Yasunori Ikeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer inspection apparatus
- Publication number 20050062960
- Publication date Mar 24, 2005
- Olympus Optical Co., Ltd.
- Haruyuki Tsuji
- G01 - MEASURING TESTING
Information Patent Application
Method and device for accessing frame memory within display panel d...
- Publication number 20040095356
- Publication date May 20, 2004
- NEC PLASMA DISPLAY CORPORATION
- Toshiaki Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor wafer inspection apparatus
- Publication number 20030202178
- Publication date Oct 30, 2003
- Olympus Optical Co., Ltd.
- Haruyuki Tsuji
- G01 - MEASURING TESTING

Katsuyuki HASHIMOTO

Person

Patents Grantslast 30 patents

Scanning laser microscope

Laser scanning microscope

Laser microscope which expands the dynamic range of an intensity si...

Substrate processing apparatus and substrate housing method

Substrate processing apparatus and substrate processing system

Method and device for accessing frame memory within display panel d...

Semiconductor wafer inspection apparatus

Patents Applicationslast 30 patents

SCANNING LASER MICROSCOPE

LASER SCANNING MICROSCOPE

LASER MICROSCOPE

VISUAL INSPECTION APPARATUS

Visual inspection apparatus

Substrate processing apparatus and substrate housing method

Substrate processing apparatus and substrate processing system

Semiconductor wafer inspection apparatus

Method and device for accessing frame memory within display panel d...

Semiconductor wafer inspection apparatus